Chinese Optics Letters, Volume. 9, Issue 10, 103101(2011)

Thermomechanical analysis of nodule damage in HfO2/SiO2 multilayer coatings

Yongguang Shan1,2, Hongbo He1, Chaoyang Wei1, Ying Wang1,2, and Yuan'an Zhao1
Author Affiliations
  • 1Key Laboratory of High-Power Laser Materials, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Science, Shanghai 201800, China
  • 2Graduate University of Chinese Academy of Sciences, Beijing 100049, China
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    References(20)

    [1] [1] C. J. Stolz, M. D. Feit, and T. V. Pistor, Appl. Opt. 45, 1594 (2006).

    [2] [2] Y. Wang, Y. Zhang, X. Liu, W. Chen, and P. Gu, Opt. Commun. 278, 317 (2007).

    [3] [3] C. J. Stolz, S. Hafeman, and T. V. Pistor, Appl. Opt. 47, C162 (2008).

    [4] [4] J. R. Milward, K. L. Lewis, K. Sheach, and R. A. Heinecke, Proc. SPIE 2114, 309 (1993).

    [5] [5] J. F. DeFord and M. R. Kozlowski, Proc. SPIE 1848, 455 (1992).

    [6] [6] X. Liu, D. Li, Y. Zhao, and X. Li, Appl. Opt. 49, 1774 (2010).

    [7] [7] X. Liu, D. Li, Y. Zhao, X. Li, and J. Shao, Appl. Surf. Sci. 256, 3783 (2010).

    [9] [9] X. Ling, J. Shao, and Z. Fan, J. Vac. Sci. Technol. A 27, 183 (2009).

    [10] [10] J. Dijon, M. Poulingue, and J. Hue, Proc. SPIE 3578, 387 (1999).

    [11] [11] R. Sawicki, C. Shang, and T. Swatloski, Proc. SPIE 2428, 333 (1994).

    [12] [12] Y. Shan, H. He, C. Wei, S. Li, M. Zhou, D. Li, and Y. Zhao, Appl. Opt. 49, 4290 (2010).

    [13] [13] C. H. Chan, Appl. Phys. Lett. 26, 628 (1975).

    [14] [14] C. Wei, J. Shao, H. He, K. Yi, and Z. Fan, Opt. Express 16, 3376 (2008).

    [15] [15] Y. Takeuti, Thermal Stress (in Chinese) (Science, Beijing, 1977).

    [16] [16] M. Poulingue, J. Dijon, M. Ignat, H. Leplan, and B. Pinot, Proc. SPIE 3578, 370 (1999).

    [17] [17] J. Dijon, G. Ravel, and B. Andre, Proc. SPIE 3578, 398 (1999).

    [18] [18] T. Spalvins and W. A. Brainard, J. Vac. Sci. Technol. 11, 1186 (1974).

    [19] [19] F. Bonneau, P. Combis, J. L. Rullier, J. Vierne, B. Bertussi, M. Commandre, L. Gallais, J. Y. Ntoli, I. Bertron, F. Malaise, and J. T. Donohue, Appl. Phys. B 78, 447 (2004).

    [20] [20] C. Stolz, F. Genin, T. Reitter, N. Molau, R. Bevis, M. Gunten, D. Smith, and J. Anzellotti, Proc. SPIE 2966, 265 (1997).

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