Acta Optica Sinica, Volume. 27, Issue 11, 2082(2007)
A Spectrometer Method for Determining Thickness of Quartz Plate Along the Crystal Axis
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[in Chinese], [in Chinese], [in Chinese], [in Chinese]. A Spectrometer Method for Determining Thickness of Quartz Plate Along the Crystal Axis[J]. Acta Optica Sinica, 2007, 27(11): 2082
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