Infrared Technology, Volume. 43, Issue 9, 889(2021)
Fault Diagnosis of Reliability Test for Low-Light-Level Vision Device Based on Structural Similarity Algorithm
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LI Yongtao, HE Yalei, WU Fengling. Fault Diagnosis of Reliability Test for Low-Light-Level Vision Device Based on Structural Similarity Algorithm[J]. Infrared Technology, 2021, 43(9): 889
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