Blind noisy image separation based on a new robust independent component analysis network

[in Chinese]; [in Chinese]

Chinese Optics Letters, Volume. 4, Issue 10, 573(2006)

[in Chinese]¹ and [in Chinese]^2,3

Author Affiliations

¹Department of Computer Science and Technology, Northwestern Polytechnical University, Xi'an 710072

²Department of Applied Mathematics, Northwestern Polytechnical University, Xi'an 710072

³Key Laboratory of Education Ministry for Image Processing and Intelligent Control, Huazhong University of Science and Technology, Wuhan 430074

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References(11)

[1] [1] X. Chai, C. Zhou, Z. Feng, Y. Wang, and Y. Zuo, Chin. Opt. Lett. 4, 11 (2006).

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[5] [5] S. Pandey, N. Billor, and A. Turkmen, Int. Conf. on Statistics, Combinatorics, Mathematics and Applications (2005).

[6] [6] M. Hubert, P. J. Rousseeuw, and K. Vanden Branden, Technometrics 47, 64 (2005).

[7] [7] P. J. Rousseeuw and K. Van Driessen, Technometrics 41, 212 (1999).

[8] [8] S. Cruces, L. Castedo, and A. Cichocki, Neurocomputing 49, 87 (2002).

[9] [9] A. Hyvarinen, IEEE Trans. NN 10, 626 (1999).

[10] [10] A. Cichocki and S. Amari, Adaptive Blind Signal and Image Processing (John Wiley and Sons, Cichester, 2002).

[11] [11] X. Giannakopoulos, J. Karhunen, and E. Oja, Int. J. Neural Systems 9, 99 (1999).

CLP Journals

[1] [in Chinese], [in Chinese], [in Chinese]. Algorithm Research of Adaptive Fuzzy Image Enhancement in Ridgelet Transform Domain[J]. Acta Optica Sinica, 2007, 27(7): 1183

[2] Liu Jingbo, Wan Xiaolei, Jin Weidong. Separating Reflections from Image Using Fast Kernel Independent Component Analysis[J]. Laser & Optoelectronics Progress, 2010, 47(5): 51001

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[in Chinese], [in Chinese], "Blind noisy image separation based on a new robust independent component analysis network," Chin. Opt. Lett. 4, 573 (2006)

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Paper Information

Received: May. 23, 2006

Accepted: --

Published Online: Oct. 31, 2006

The Author Email:

DOI:

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology