[1] Lingadurai K, Nagarajan E R, Sundarakannan B et al[D]. J. Lumin, 177, 249(2016).

[2] Chen G W, Li Y B, Qi W C et al[D]. Journal of Materials Science: Materials in Elecuronics, 29, 2841(2018).

[3] Chung M H, Kim J H[D]. Journal of the Korean Physical Society, 72, 431(2018).

[4] Chung M H, Kim J H[D]. Appl. Sci. Converg. Technol, 26, 26(2017).

[5] Bordun I O, Bordun O M, Kukharskyy I Y[D]. Journal of Applied Spectroscopy, 84, 249(2017).

[6] Chen Z M, Jiang S X, Xin B J et al[D]. Journal of Materials Science: Materials in Electronics, 29, 17795(2018).

[7] Liao N, Shi L, Wang L et al[D]. Thin Solid Films, 518, 4817(2010).

[8] Chong M K, Kam C H, Pita K[D]. Materials Chemistry and Physics, 100, 329(2006).

[9] Cui H, Zhang J, Zhu P F et al[D]. J. Appl. Phys, 115, 023502(2014).

[10] Den E D, Harris P G, Ireland T G et al[D]. J. Mater. Chem. C, 4, 8930(2016).

[11] Kaptay G[D]. J. Nanosci. Nanotechnol, 12, 2625(2012).

[12] Guo B, Navrotsky A, Zhang P et al[D]. J. Phys. Chem. C, 112, 932(2008).

[13] Hu L S, Wen J, Yin M et al[D]. Current Applied Physics, 12, 732(2012).

[14] Chang H C, Chang Y M, Wang J W et al[D]. Chemical Physics Letters, 405, 314(2005).

[15] Chen Z M, Guo R H, Jing S X et al[D]. Materials Technology, 31, 7(2016).

[16] Chen Z M, Jiang S X, Xin B J et al[D]. Journal of Materials Science: Materials in Electronics, 29, 837(2018).

[17] Den E D, Fem G R, Ireland T G et al[D]. Nanotechnology, 29, 455703(2018).