Fig. 1. Dispersion curves of refractive index and extinction coefficient of thin film materials (a) n (λ) and k (λ) of Si; (b) n (λ) and k (λ) of SiO₂

Fig. 2. Reflection characteristics of dielectric mirrors for TFPF (a) The reflectance spectrum, (b) The reflection phase shift dispersion curve

Fig. 3. Transmission spectrum of TFPF with different cavity length before and after reflection phase shift considered (a) d: 850~1 200 nm, ∆d=25 nm, ϕλ=0, m = 1, (b) d: 1 700~ 2 400 nm, ∆d=50 nm, ϕλ=0, m = 2, (c) d: 850~1 200 nm, ∆d=25 nm, ϕλ≠0, m = 0, (d) d: 1 700-2 400 nm, ∆d=50 nm, ϕλ≠0, m = 1

Fig. 4. The relationship between peak position of passband and cavity length for TFPF (a) d: 850~1 200 nm, ∆d=25 nm; (b) d: 1 700~2 400 nm, ∆d=50 nm

Fig. 5. Comparison of peak transmission for TFPF before and after reflection phase shift considered (a) d: 850~1 200 nm, ∆d=25 nm, (b) d: 17 00~2 400 nm, ∆d=50 nm

Fig. 6. Curves of FWHM versus peak position for TFPF (a) d: 850~1 200 nm, ∆d=25 nm, (b) d: 1 700~2 400 nm, ∆d=50 nm