Semiconductor Optoelectronics, Volume. 46, Issue 3, 416(2025)

CMOS Movement-Temperature-Coefficient Correction Model and Effect Verification

ZHU Xuewu1, ZHAN Chunlian1, GUO Jing2, GAO Han1, WANG Jiapeng1, YU Changben1, KONG Deren3, SHANG Fei3, and XU Chundong3
Author Affiliations
  • 1School of Optics and Electronic Science and Technology, China Jiliang University, Hangzhou 310018, CHN
  • 2Beijing Zhenxing Institute of Metrology and Test, Beijing 100074, CHN
  • 3School of Mechanical Engineering, Nanjing University of Science and Technology, Nanjing 210094, CHN
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    References(8)

    [3] [3] Abarca A, Theuwisse A. A CMOS image sensor dark current compensation using in pixel temperature sensors[J]. Sensors, 2023, 23(22): 9109.

    [5] [5] Bosco A, Bruna A, Naccari F, et al. Hardware/software solution for high precision defect correction in digital image sensors[C]//2008 IEEE International Symposium on Consumer Electronics, 2008: 1-4.

    [6] [6] Jain A, Gupta R. A survey on defect and noise detection and correction algorithms in image sensors[C]//2015 International Conference on Advances in Computer Engineering and Applications, 2015: 754-759.

    [7] [7] Sun J, Wu J, Huang Y, et al. Research on the influence upon accuracy of temperature measuring in distance and correction method[C]//2009 Asia-Pacific Conference on Information Processing, 2009: 278-280.

    [8] [8] Liu Z, Xu J, Wang X, et al. A fixed-pattern noise correction method based on gray value compensation for TDI CMOS image sensor[J]. Sensors, 2015, 15(9): 23496-23513.

    [9] [9] Hu C, Bai Y, Tang P. Denoising algorithm for the pixel-response non-uniformity correction of a scientific CMOS under low light conditions[J]. ISPRS - International Archives of the Photogrammetry, Remote Sensing and Spatial Information Sciences, 2016, XLI-B3: 749-753.

    [11] [11] Zhu J, Wang B T, Liang T, et al. A high-precision temperature measurement method through correcting reflected radiation under high-temperature background[J]. IEEE Transactions on Instrumentation and Measurement, 2023, 72: 9508808.

    [15] [15] Hammig M D, Kang T, Jeong M, et al. Suppression of interface-induced noise by the control of electron-phonon interactions[J]. IEEE Transactions on Nuclear Science, 2013, 60(4): 2831-2839.

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    ZHU Xuewu, ZHAN Chunlian, GUO Jing, GAO Han, WANG Jiapeng, YU Changben, KONG Deren, SHANG Fei, XU Chundong. CMOS Movement-Temperature-Coefficient Correction Model and Effect Verification[J]. Semiconductor Optoelectronics, 2025, 46(3): 416

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    Paper Information

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    Received: Jul. 29, 2024

    Accepted: Sep. 18, 2025

    Published Online: Sep. 18, 2025

    The Author Email:

    DOI:10.16818/j.issn1001-5868.20240729001

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