[2] [2] Li Xiaodong, Li Xiaoling. The analysion of influence on measurement accuracy of profile instruments［J］. Physical Testing and Chemical Analysis Part A: Physical Testing, 2005, 41(3): 134-136.

[3] [3] He Jiaxiang, Zhang Dawei. Study on technology for on-line testing the thickness with coplane capacitor［J］. Journal of Tianjin University, 1994, 27(2): 250-256.

[4] [4] Shi Libo, Qiu Lirong, Wang Yun, et al. Development of central lens thickness measurement system using laser differential confocal microscopy［J］. Chinese Journal of Scientific Instrument, 2012, 33(3): 683-688.

[5] [5] Zhao Weiqian, Shen Yang, Qiu Lirong, et al. Lenses axial space measurement by laser confocal technology［J］. Laser & Optoelectronics Progress, 2015, 52(3): 031205.

[6] [6] Qiao Yang, Zhang Ning, Liu Tao, et al. Optical system design for the measurement of center thickness of lens based on confocal technology［J］. Optical Technique, 2010, 36(6): 857-859.

[7] [7] Zhou Yong, Guo Banghui, Wang Xiaoxun, et al. Design of lens central thickness measuring optical system［J］. Laser & Optoelectronics Progress, 2016, 53(3): 031201.

[8] [8] Lu Yi, Xu Xiping, Shi Nuo, et al. Research on measurement method and apparatus for lens center thickness［J］. Journal of Changchun University of Science and Technology, 2013, 36(3-4): 28-31.

[9] [9] Goncharov A V, Bailón L L, Devaney N M, et al. Optical testing of lens systems with concentric design［C］. SPIE, 2009, 7389: 738912.

[10] [10] Jiang Jiadong, Yuan Daocheng, Pu Jie. Research on on-line-measuring clearance of assembly parts based on image measurement technology［J］. Journal of Transducer Technology, 2005, 24(12): 26-28.

[11] [11] Gao Ming, Huang Dingjin, Liu Jun. The measurement instrument of center thickness of lens［J］. Journal of Xi′an Technological University, 2003, 23(3): 234-236.

[12] [12] de Groot P. Optical gap measuring apparatus and method: America, 5557399［P］. 1996-9-17.

[13] [13] Courteville A, Wilhelm R, Delaveau M, et al. Non-contact in-process metrology using a high-accuracy low-coherence interferometer［C］. Laser Metrology and Machine Performance VII, 7th International Conference and Exhibition on Laser Metrology, Machine Tool, CMM and Robotic Performance, 2005: 534-544.

[14] [14] Wilhelm R, Courteville A, Garcia F. Dimensional metrology for the fabrication of imaging optics using a high accuracy low coherence interferometer［C］. SPIE, 2005: 469-480.

[15] [15] Schmitt J M. Optical coherence tomography (OCT): a review［J］. IEEE Journal of Selected Topics in Quantum Electronics, 1999, 5(4): 1205-1215.

[16] [16] Shi Zhonghua, Yang Baoxi, Hu Xiaobang, et al. Lens surface distance measurement with large range and high precision based on low coherence interferometry［J］. Acta Optica Sinica, 2016, 36(6): 0612001.

[17] [17] Zhao Shuyue. The research of low-coherence interferometer based distributed optical fiber sensing system［D］. Hefei: Anhui University, 2011.

[18] [18] Wang Jinjing. Development of balanced homodyne detector［D］. Shanxi University, Taiyuan: 2012.

[19] [19] Larkin K G. Efficient nonlinear algorithm for envelope detection in white light interferometry［J］. Journal of the Optical Society of America A, 1996, 13(4): 832-843.

[21] [21] Zhang Zhuo, Chen Zhong, Zhong Li. An updated Edlen equation under low air pressure based on pattern search method［J］. Acta Metrologica Sinica, 2005, 26(3): 221-224.

[22] [22] Li Hui, Xie Shusen, Lu Zukang. Dispersion, group velocity and group refractive index［J］. Acta Photonica Sinica, 1999, 28(12): 1075-1079.