[1] Yan M, Bai Q, Li G et al. Study on the performance of high-speed CMOS image sensors in transient imaging mode[J]. Infrared and Laser Engineering, 51, 20210694(2022).

[2] Wang G Y, Xie L L, Bu H B. Design method of pixel modulation transfer function and signal-to-noise ratio for CMOS image sensor[J]. Laser & Optoelectronics Progress, 58, 2011002(2021).

[3] Shang Y Y, Zhang W G, Song Y et al. Research on evaluation method of CMOS imager[J]. Laser & Optoelectronics Progress, 47, 051101(2010).

[4] Bigas M, Cabruja E, Forest J et al. Review of CMOS image sensors[J]. Microelectronics Journal, 37, 433-451(2006).

[5] Irie K, McKinnon A E, Unsworth K et al. A technique for evaluation of CCD video-camera noise[J]. IEEE Transactions on Circuits and Systems for Video Technology, 18, 280-284(2008).

[6] Konnik M, Welsh J. High-level numerical simulations of noise in CCD and CMOS photosensors: review and tutorial[EB/OL]. https:∥arxiv.org/abs/1412.4031

[7] Bu F, Yao D L, Yang Y Q et al. Research on modeling and simulation of full link noise in CCD camera system[J]. Proceedings of SPIE, 12747, 127470M(2023).

[8] Foi A, Trimeche M, Katkovnik V et al. Practical Poissonian-Gaussian noise modeling and fitting for single-image raw-data[J]. IEEE Transactions on Image Processing, 17, 1737-1754(2008).

[9] Zhang Y, Wang G Y, Xu J T. Parameter estimation of signal-dependent random noise in CMOS/CCD image sensor based on numerical characteristic of mixed Poisson noise samples[J]. Sensors, 18, 2276(2018).

[10] Li J Y, Wu Y Q, Zhang Y et al. Parameter estimation of Poisson-Gaussian signal-dependent noise from single image of CMOS/CCD image sensor using local binary cyclic jumping[J]. Sensors, 21, 8330(2021).

[11] Han B Y. Research on noise model and noise suppression methods of CMOS imaging devices[D](2012).

[12] Mao C L. A research of testing technology for main noises of CMOS image sensor[D](2017).

[13] Findlater K M, Vaillant J M, Baxter D J et al. Source follower noise limitations in CMOS active pixel sensors[J]. Proceedings of SPIE, 5251, 187-195(2004).

[14] Deptuch G, Berst J D, Claus G et al. Design and testing of monolithic active pixel sensors for charged particle tracking[J]. IEEE Transactions on Nuclear Science, 49, 601-610(2002).

[15] Blanksby A J, Loinaz M J. Performance analysis of a color CMOS photogate image sensor[J]. IEEE Transactions on Electron Devices, 47, 55-64(2000).

[16] Wei K X, Fu Y, Yang J L et al. A physics-based noise formation model for extreme low-light raw denoising[C], 2755-2764(2020).

[17] Jähne B. EMVA 1288 standard for machine vision: objective specification of vital camera data[J]. Optik & Photonik, 5, 53-54(2010).

[18] Razali N M, Wah Y B. Power comparisons of shapiro-wilk, kolmogorov-smirnov, lilliefors and anderson-darling tests[J]. Journal of Statistical Modeling and Analytics, 2, 21-33(2011).

[19] Freimer M, Kollia G, Mudholkar G S et al. Extremes, extreme spacings and outliers in the tukey and weibull families[J]. Communications in Statistics-Theory and Methods, 18, 4261-4274(1989).

[20] Fiete R D, Tantalo T A. Comparison of SNR image quality metrics for remote sensing systems[J]. Optical Engineering, 40, 574-585(2001).

[21] Yang M J, Qian Y S, Yan Y Y et al. Scintillation noise test system of image intensifier based on CMOS image sensor[J]. Laser & Optoelectronics Progress, 60, 0222001(2023).