Quantitative Analysis of Surface-Enhanced Raman Scattering Based on Internal Standard Method

Haojian Xing; Zenghe Yin; Jie Zhang; Yong Zhu

doi:10.3788/LOP57.030002

Laser & Optoelectronics Progress, Volume. 57, Issue 3, 030002(2020)

Quantitative Analysis of Surface-Enhanced Raman Scattering Based on Internal Standard Method

Haojian Xing, Zenghe Yin, Jie Zhang^*, and Yong Zhu

Key Laboratory for Optoelectronic Technology & System, Ministry of Education, College of Optoelectronic Engineering, Chongqing University, Chongqing 400044, China

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Haojian Xing, Zenghe Yin, Jie Zhang, Yong Zhu. Quantitative Analysis of Surface-Enhanced Raman Scattering Based on Internal Standard Method[J]. Laser & Optoelectronics Progress, 2020, 57(3): 030002

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Paper Information

Category: Reviews

Received: Jun. 17, 2019

Accepted: Jul. 31, 2019

Published Online: Feb. 17, 2020

The Author Email: Jie Zhang (zhangjie@cqu.edu.cn)

DOI:10.3788/LOP57.030002

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology