Laser & Optoelectronics Progress, Volume. 53, Issue 4, 43101(2016)
Determination of Optical Constants and Thickness of Polymer Semiconductor Thin Film by Reflectivity Fitting Method
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Li Guolong, Zhong Jingming, Wang Lihui, Li Jin, He Lijun, Li Haibo, Gao Mangmang. Determination of Optical Constants and Thickness of Polymer Semiconductor Thin Film by Reflectivity Fitting Method[J]. Laser & Optoelectronics Progress, 2016, 53(4): 43101
Category: Thin Films
Received: Oct. 9, 2015
Accepted: --
Published Online: Mar. 25, 2016
The Author Email: Guolong Li (331932137@qq.com)