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Laser & Optoelectronics Progress, Volume. 53, Issue 4, 43101(2016)

Determination of Optical Constants and Thickness of Polymer Semiconductor Thin Film by Reflectivity Fitting Method

Li Guolong1,2、*, Zhong Jingming1, Wang Lihui1, Li Jin2, He Lijun2, Li Haibo2, and Gao Mangmang2
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    Article index updated: Mar. 15, 2025

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    Li Guolong, Zhong Jingming, Wang Lihui, Li Jin, He Lijun, Li Haibo, Gao Mangmang. Determination of Optical Constants and Thickness of Polymer Semiconductor Thin Film by Reflectivity Fitting Method[J]. Laser & Optoelectronics Progress, 2016, 53(4): 43101

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    Paper Information

    Category: Thin Films

    Received: Oct. 9, 2015

    Accepted: --

    Published Online: Mar. 25, 2016

    The Author Email: Guolong Li (331932137@qq.com)

    DOI:10.3788/lop53.043101

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology