Thickness Measurement of Insulation Coating by NIR Spectrometry Based on Boosting-KPLS

HAO Hui-min; LI Shi-wei; ZHANG Wen-dong; LI Peng-wei; HAO Jun-yu; LU Hai-ning; Ken Jia; ZHANG Yong

doi:10.3964/j.issn.1000-0593(2011)08-2081-05

Spectroscopy and Spectral Analysis, Volume. 31, Issue 8, 2081(2011)

Thickness Measurement of Insulation Coating by NIR Spectrometry Based on Boosting-KPLS

HAO Hui-min^1,2, LI Shi-wei³, ZHANG Wen-dong¹, LI Peng-wei¹, HAO Jun-yu², LU Hai-ning², Ken Jia⁴, and ZHANG Yong⁵

Author Affiliations

¹Micro/Nano System Research Center, Taiyuan University of Technology, Taiyuan 030024, China

²Automation Company of TISCO, Taiyuan 030003, China

³Northwest Institute of Nuclear Technology, Xi’an 710024, China

⁴Department of Research and Development, Brimrose Corporation of America, Baltimore 21152-9201, USA

⁵State Key Laboratory of Electrical Insulation for Power Equipment, Xi’an Jiaotong University, Xi’an 710049, China

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HAO Hui-min, LI Shi-wei, ZHANG Wen-dong, LI Peng-wei, HAO Jun-yu, LU Hai-ning, Ken Jia, ZHANG Yong. Thickness Measurement of Insulation Coating by NIR Spectrometry Based on Boosting-KPLS[J]. Spectroscopy and Spectral Analysis, 2011, 31(8): 2081

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Paper Information

Received: Aug. 11, 2010

Accepted: --

Published Online: Aug. 29, 2011

The Author Email:

DOI:10.3964/j.issn.1000-0593(2011)08-2081-05

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