[1] [1] Liao Fei, Li Lin, Lu Changwen. Proceedings of SPIE, 2016, 10154: UNSP101541G.

[2] [2] Packard C D, Viola T S, Klein M D. Proceedings of SPIE, 2017, 10432: UNSP1043208.

[3] [3] Zhou Hongmin, Wang Zhe, Ma Wu, et al. IEEE Journal of Selected Topics in Applied Earth Observations and Remote Sensing, 2022, 15: 849.

[4] [4] Yan Kai, Li Hanliang, Song Wanjuan, et al. IEEE Transactions on Geoscience and Remote Sensing, 2022, 60: 4401816.

[5] [5] Cook R L, Torrance K E. ACM Transactions on Graphics, 1982, 1(1): 7.

[6] [6] Torrance K E, Sparrow E M. Journal of the Optical Society of America, 1967, 57(9): 1105.

[8] [8] Claustres L, Boucher Y, Paulin M. Conference on Wavelet and Independent Component Analysis Applications IX. 2002. Orlando, Fl.

[10] [10] Nicodemus F E, Richmond J C, Hsia J J, et al. National Bureau of Standards(U.S.). 1977.

[12] [12] Li Hongsong, Chen Meng, Deng Chenyang, et al. Optical Engineering, 2019, 58(12): 124106.

[14] [14] Qin Feng, Yang Weiping, Yang Jia, et al. Proceedings of SPIE-The International Society for Optical Engineering, 2013, 9045(4): 90451D.

[15] [15] Izumi Nishidate, Takaaki Maeda, Kyuichi Niizeki, et al. Sensors(Basel, Switzerland), 2013, 13(6): 7902.

[16] [16] Agahian F, Funt B. Journal of the Optical Society of America A, 2014, 31(7): 1445.