Chinese Journal of Lasers, Volume. 50, Issue 6, 0603002(2023)

Investigation of Surface Improvement of GaAs/Si(001) with Strain Balanced Superlattice

Jiachen Li, Jun Wang*, Chunyang Xiao, Haijing Wang, Yanxing Jia, Zhuoliang Liu, Bojie Ma, Rui Ming, Qing Ge, Hao Zhai, Feng Lin, Weiyu He, Yongqing Huang, and Xiaomin Ren
Author Affiliations
  • State Key Laboratory of Information Photonics and Optical Communications, Beijing University of Posts and Telecommunications, Beijing 100876, China
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    Figures & Tables(8)
    Schematic diagram of material, strain and thickness of each period of periodic superlattice
    Schematic diagram of material and structure of strain balanced superlattice
    Measured surface toughness of samples A and B ( measurement range is 10 μm×10 μm). (a)-(e) Sample A; (f)-(j) sample B
    Schematic diagrams of growth modes and surface morphology characteristic of samples A and B. (a) Schematic diagram of step flow growth mode; (b) schematic diagram of FM growth mode; (c) surface morphology characterization of sample A (1 μm×1 μm); (d) surface morphology characterization of sample B (1 μm×1 μm)
    Comparison of PL curves of GaAs epitaxial layer of samples A and B. (a) Center; (b) right; (c) lower; (d) left; (e) upper
    XRD characterization curves of GaAs epitaxial layer of samples A and B
    • Table 1. Surface toughness of samples A and B

      View table

      Table 1. Surface toughness of samples A and B

      SampleRoot-mean-square(RMS)of surface toughness of different locations /nmAverage of RMS /nmStandard deviation of RMS
      CenterUpperRightLowerLeft
      A1.161.011.520.931.201.160.22
      B1.811.361.692.022.731.920.51
    • Table 2. PL intensity, FWHM and their mean value of samples A and B

      View table

      Table 2. PL intensity, FWHM and their mean value of samples A and B

      LocationPL intensityFWHM /nm
      Sample ASample BSample ASample B
      Average40378672623.431.6
      Center46200706323.231.3
      Upper48539454222.731.5
      Right46745233322.931.3
      Lower319611537823.932.5
      Left28443431624.331.3
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    Jiachen Li, Jun Wang, Chunyang Xiao, Haijing Wang, Yanxing Jia, Zhuoliang Liu, Bojie Ma, Rui Ming, Qing Ge, Hao Zhai, Feng Lin, Weiyu He, Yongqing Huang, Xiaomin Ren. Investigation of Surface Improvement of GaAs/Si(001) with Strain Balanced Superlattice[J]. Chinese Journal of Lasers, 2023, 50(6): 0603002

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    Paper Information

    Category: Materials

    Received: Apr. 27, 2022

    Accepted: Jun. 1, 2022

    Published Online: Feb. 28, 2023

    The Author Email: Wang Jun (wangjun12@bupt.edu.cn)

    DOI:10.3788/CJL220798

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