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Spectroscopy and Spectral Analysis, Volume. 33, Issue 8, 2188(2013)

Using In-Situ Reflectance to Monitor the Chlorophyll Concentration in the Surface Layer of Tidal Flat

XING Qian-guo*, YU Ding-feng, LOU Ming-jing, L Ying-chun, LI Shao-peng, and HAN Qiu-ying
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    XING Qian-guo, YU Ding-feng, LOU Ming-jing, L Ying-chun, LI Shao-peng, HAN Qiu-ying. Using In-Situ Reflectance to Monitor the Chlorophyll Concentration in the Surface Layer of Tidal Flat[J]. Spectroscopy and Spectral Analysis, 2013, 33(8): 2188

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    Paper Information

    Received: Dec. 5, 2012

    Accepted: --

    Published Online: Aug. 12, 2013

    The Author Email: XING Qian-guo (qgxing@yic.ac.cn)

    DOI:10.3964/j.issn.1000-0593(2013)08-2188-04

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology