Infrared Technology, Volume. 44, Issue 6, 635(2022)

Quantitative Identification and Comparative Study of Defects Based on Phase and Surface Temperatures

Lin CHEN1、*, Minqian LI1, Feng GAO1, Min LIU2, and Chi ZHANG1
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  • 1[in Chinese]
  • 2[in Chinese]
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    References(2)

    [2] [2] LIU J Y, GONG J L, QIN L, et al. Three-dimensional visualization of subsurface defect using lock-in thermography[J]. International Journal of' Thermophysics, 2015, 36(5/6): 1226-1235.

    [11] [11] WEI Yanjie, SU Zhilong, MAO Shuangshuang, et al. An infrared defect sizing method based on enhanced phase images[J]. Sensors, 2020, 20(13): E3626-E3626.

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    CHEN Lin, LI Minqian, GAO Feng, LIU Min, ZHANG Chi. Quantitative Identification and Comparative Study of Defects Based on Phase and Surface Temperatures[J]. Infrared Technology, 2022, 44(6): 635

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    Paper Information

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    Received: Nov. 9, 2020

    Accepted: --

    Published Online: Jul. 25, 2022

    The Author Email: Lin CHEN (chenlinhonghu@163.com)

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