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Spectroscopy and Spectral Analysis, Volume. 30, Issue 1, 184(2010)

Monitoring Stripe Rust of Winter Wheat Using PHI Based on Sensitive Bands

LUO Ju-hua1,2、*, HUANG Wen-jiang1, GU Xiao-he1, JI Ning1, MA Li1, SONG Xiao-yu1, LI Wei-guo1, and WEI Zhao-ling2
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  • 1[in Chinese]
  • 2[in Chinese]
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    LUO Ju-hua, HUANG Wen-jiang, GU Xiao-he, JI Ning, MA Li, SONG Xiao-yu, LI Wei-guo, WEI Zhao-ling. Monitoring Stripe Rust of Winter Wheat Using PHI Based on Sensitive Bands[J]. Spectroscopy and Spectral Analysis, 2010, 30(1): 184

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    Paper Information

    Received: Feb. 11, 2009

    Accepted: --

    Published Online: Jul. 13, 2010

    The Author Email: Ju-hua LUO (luojuhua@126.com)

    DOI:10.3964/j.issn.1000-0593(2010)01-0184-04

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology