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APPLIED LASER, Volume. 33, Issue 3, 294(2013)

Measure and Analysis the Residual Stress of the Area of Protective Coating Containing Ni by Pulsed Laser Discrete Scratching Testing

Cao Yupeng1,2、*, Xue Wei3, Feng Aixin1,3, and Han Zhenchun1,4
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  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
  • 4[in Chinese]
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    [6] [6] FREUND L B, SURESH S． Thin film materials-stress,defect formation and surface evolution[M]． Cambridge: University of Cambridge Press, 2006: 228-230, 253-256, 277-280．

    CLP Journals

    [1] Hua Guoran, Zhou Dongcheng, Cao Yupeng, Feng Aixin, Chen Haotian. Research Progress of Quantitatively Controlling Surface Residual Stress by Laser Shock Processing[J]. Laser & Optoelectronics Progress, 2016, 53(10): 100001

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    Cao Yupeng, Xue Wei, Feng Aixin, Han Zhenchun. Measure and Analysis the Residual Stress of the Area of Protective Coating Containing Ni by Pulsed Laser Discrete Scratching Testing[J]. APPLIED LASER, 2013, 33(3): 294

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    Paper Information

    Received: Nov. 10, 2012

    Accepted: --

    Published Online: Aug. 28, 2013

    The Author Email: Yupeng Cao (cyp19812004@126.com)

    DOI:10.3788/al20133303.294

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology