Chinese Optics Letters, Volume. 13, Issue 2, 020502(2015)

Diffractive self-imaging based on selective etching of a ferroelectric domain inversion grating

Yunlin Chen*, Tianwei Fan, and Man Tong
Author Affiliations
  • Institute of Applied Micro-Nano Materials, School of Science, Beijing Jiaotong University, Beijing 100044, China
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    Figures & Tables(7)
    Hexagonal array grating.
    Numerical simulation TDSI (for Δφ=0.35π); (a)–(d) with respect to distance coefficient β=2, 3, 5, and 10; (e)–(h) with respect to distance coefficient β=0.10, 0.33, 0.50, and 0.70.
    Waveform for the 2D ferroelectric domain inversion MgLN.
    Fabricated MgLN domain inversion patterns; (a) optical microscope image; (b) SEM image.
    Raman spectra collected at the original (noninverted) and domain inverted areas.
    Experimental setup of diffraction self-imaging.
    Experimental TDSI patterns obtains (Δφ=0.35π); (a)–(d) on β=2, 3, 5, and 10 planes; (e)–(h) on β=0.10, 0.33, 0.50, and 0.70 planes.
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    Yunlin Chen, Tianwei Fan, Man Tong, "Diffractive self-imaging based on selective etching of a ferroelectric domain inversion grating," Chin. Opt. Lett. 13, 020502 (2015)

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    Paper Information

    Category: Diffraction and Gratings

    Received: Sep. 4, 2014

    Accepted: Nov. 28, 2014

    Published Online: Sep. 25, 2018

    The Author Email: Yunlin Chen (ylchen@bjtu.edu.cn)

    DOI:10.3788/COL201513.020502

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