Researching | Vacuum metrology based on refractive index of gas

Acta Physica Sinica, Volume. 69, Issue 15, 150601-1(2020)

Vacuum metrology based on refractive index of gas

Yu-Rong Xu¹, Yang-Yang Liu¹, Jin Wang^1,2、*, Yu Sun^1,2, Zhen-Hua Xi³, De-Tian Li³, and Shui-Ming Hu^1,2

Author Affiliations

¹Hefei National Laboratory for Physical Sciences at Microscale, University of Science and Technology of China, Hefei 230026, China

²CAS Center for Excellence in Quantum Information and Quantum Physics, University of Science and Technology of China, Hefei 230026, China

³Science and Technology on Vacuum Technology and Physics Laboratory, Lanzhou Institute of Physics, Lanzhou 730000, China

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References(21)

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Yu-Rong Xu, Yang-Yang Liu, Jin Wang, Yu Sun, Zhen-Hua Xi, De-Tian Li, Shui-Ming Hu. Vacuum metrology based on refractive index of gas[J]. Acta Physica Sinica, 2020, 69(15): 150601-1

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Received: May. 12, 2020

Accepted: --

Published Online: Dec. 30, 2020

The Author Email:

DOI:10.7498/aps.69.20200706

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