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Chinese Optics Letters, Volume. 8, Issue 2, 181(2010)

Qualification of superpolished substrates for laser-gyro by surface integrated scatter measurement

Zhimeng Wei, Xingwu Long, and Kaiyong Yang
Author Affiliations
  • College of Optoelectric Science and Engineering, National University of Defense Technology, Changsha 410073, China
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    Zhimeng Wei, Xingwu Long, Kaiyong Yang, "Qualification of superpolished substrates for laser-gyro by surface integrated scatter measurement," Chin. Opt. Lett. 8, 181 (2010)

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    Paper Information

    Received: Aug. 15, 2009

    Accepted: --

    Published Online: Mar. 5, 2010

    The Author Email:

    DOI:10.3788/COL20100802.0181

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology