Laser & Optoelectronics Progress, Volume. 62, Issue 12, 1212004(2025)

High-Precision Phase Retrieval for Shack-Hartmann Wavefront Sensors Using Modal Reconstruction and an Improved Adaptive Stochastic Parallel Gradient Descent Algorithm

Feikuai Fang1,2,3, Changwei Li2,3,4、*, and Min Lai1
Author Affiliations
  • 1School of Physics and Optoelectronic Engineering, Nanjing University of Information Science & Technology, Nanjing 210044, Jiangsu , China
  • 2Nanjing Institute of Astronomical Optics & Technology, Chinese Academy of Sciences, Nanjing 210042, Jiangsu , China
  • 3Key Laboratory of Astronomical Optics & Technology, Nanjing Institute of Astronomical Optics & Technology, Chinese Academy of Sciences, Nanjing 210042, Jiangsu , China
  • 4School of Astronomy and Space Science, University of Chinese Academy of Sciences, Beijing 100049, China
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    Figures & Tables(16)
    Geometric relationship of the local slope for a single lens
    Flow chart of ASPGD
    Schematic diagram of the optical path of the iterative diffraction process
    Schematic diagrams of the simulated optical path. (a) Pupil plane image; (b) microlens arrays; (c) focal plane imaging
    Results of phase recovery. (a) Input phase; (b) (c) phase recovery results reconstructed by the modal algorithm and the corresponding residual; (d) (e) phase recovery results by the proposed algorithm and the corresponding residual
    Comparison of the Zernike coefficients between the input phase and the recovery phase
    Evaluation of the cost function
    Evaluation function of different learning rates
    Evaluation function of different disturbance coefficients
    Evaluation function variation curves
    Results of phase recovery. (a) Input phase; (b) (c) phase recovery results reconstructed by the SPGD algorithm and the corresponding residual; (d) (e) phase recovery results by the proposed algorithm and the corresponding residual
    Results of phase recovery at a Gaussian noise signal-to-noise ratio of 5 dB. (a) Input phase; (b) (c) phase recovery results reconstructed by the modal algorithm and the corresponding residual; (d) (e) phase recovery results by the proposed algorithm and the corresponding residual
    Zernike coefficients recovered at a Gaussian noise signal-to-noise ratio of 5 dB
    • Table 1. The residuals of ASPGD and SPGD under different values of Δa

      View table

      Table 1. The residuals of ASPGD and SPGD under different values of Δa

      ΔaPV /λRMS /λ
      modal + ASPGDmodal + SPGDmodal + ASPGDmodal + SPGD
      0.0010.020.240.0030.017
      0.0050.020.020.0030.003
      0.0100.020.130.0030.011
      0.0200.030.720.0040.091
      0.0500.0913.910.0080.742
    • Table 2. The residuals of the partial random input phase

      View table

      Table 2. The residuals of the partial random input phase

      No.PV /λPV /λRMS /λ
      modalmodal + ASPGDmodalmodal + ASPGD
      11.360.120.020.0090.002
      20.940.090.020.0060.003
      31.270.130.020.0090.003
      40.980.080.020.0070.002
      51.190.110.020.0100.002
      61.980.140.020.0120.003
      72.530.190.040.0140.007
      81.400.160.030.0120.005
      92.390.200.030.0160.005
      101.360.270.030.0160.003
    • Table 3. The residuals with different noise types under different SNR

      View table

      Table 3. The residuals with different noise types under different SNR

      Noise typeSNR /dBPV /λRMS /λ
      modalmodal+ASPGDmodalmodal+ASPGD
      Gaussian300.150.020.0090.003
      250.160.020.0090.005
      200.180.020.0090.002
      150.210.020.0110.005
      100.270.040.0150.006
      50.390.070.0240.009
      Poisson300.140.010.0090.002
      250.120.010.0080.002
      200.130.040.0100.003
      150.170.040.0090.004
      100.340.060.0190.009
      50.580.090.0370.012
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    Feikuai Fang, Changwei Li, Min Lai. High-Precision Phase Retrieval for Shack-Hartmann Wavefront Sensors Using Modal Reconstruction and an Improved Adaptive Stochastic Parallel Gradient Descent Algorithm[J]. Laser & Optoelectronics Progress, 2025, 62(12): 1212004

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Dec. 11, 2024

    Accepted: Jan. 2, 2025

    Published Online: Jun. 25, 2025

    The Author Email: Changwei Li (cwli@niaot.ac.cn)

    DOI:10.3788/LOP242411

    CSTR:32186.14.LOP242411

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