Chinese Journal of Liquid Crystals and Displays, Volume. 39, Issue 9, 1182(2024)

Improving circuit design for the stability of inverters based on amorphous indium gallium zinc oxide thin film transistors

Shu JIANG, Tianhao ZHANG, Xiaomin WEI, Liangdong LI, and Chengyuan DONG*
Author Affiliations
  • Department of Electronic Engineering,Shanghai Jiao Tong University,Shanghai 200240,China
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    Figures & Tables(8)
    Comparison between simulation results and experimental data.(a)Transfer characteristic curves;(b)Stretched-exponential curve fitting.
    Circuit schematics of(a)traditional pseudo-CMOS inverter and(b)revised inverter.
    Improvement mechanism of the revised inverter:(a)Variation of VGS4 and VGS5 with the input voltage;(b)Variation of VGS4 with the stress time.
    Simulation comparison of the traditional pseudo-CMOS inverter and revised inverter.(a)VTC curves;(b)Response time;(c)Output swing and its stability;(d)Power and its stability;(e)Change Ratio of tLH;(f)Change ratio of tHL.
    Relationship between VPP and response time of the revised inverter and W1/W0
    Layout of the revised inverter
    • Table 1. Model parameters of a-IGZO TFT device

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      Table 1. Model parameters of a-IGZO TFT device

      参数名称参数描述参数单位参数值
      TOXGate insulator thicknessm1e-07
      LLengthm5e-05
      WWidthm0.001
      EPSIDielectric constant of gate insulator-4.5
      XLL offset for channel length due to mask/etch effectm1e-08
      XWW offset for channel width due to mask/etch effectm1.334 1e-05
      LAMBDAChannel length modulation parameterV-10.000 972 45
      ALPHASATSaturation modulation-0.472 705
      MKnee shape parameter-8.837 31
      VMINConvergence parameterV0.471 726
      DELTATransition width parameter-9.053 56
      MUBANDConduction band mobilitym2·V-1·s-10.003 323 74
      VAACharacteristic frequencyV2 402.03
      IOLZero bias leakageA1.257 04e-11
      VDSLHole leakage VD parameterV17.629 8
      VGSLHole leakage VG parameterV2.490 35
      VGSLDVD dependency for VGSL-0.042 129 8
      IBCFback channel current factor-0.1
      VDSBCback channel VD dependencyV0.1
      MBCback channel current exponent-0.015 697 8
      VFCfront channel voltageV-11.191 5
      IFCFfront channel current factor-0.970 299
      MFCfront channel current exponentV-20.050 404 1
      SIGMA0DMinimum leakage current power factor-0.05
    • Table 2. Influence of channel width on performance of revised inverters

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      Table 2. Influence of channel width on performance of revised inverters

      M1↑M3↑M4↑M5↑
      输出高电平
      输出低电平
      上升时间↑↑↑↑↑↓↓↓↓↓
      下降时间↓↓
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    Shu JIANG, Tianhao ZHANG, Xiaomin WEI, Liangdong LI, Chengyuan DONG. Improving circuit design for the stability of inverters based on amorphous indium gallium zinc oxide thin film transistors[J]. Chinese Journal of Liquid Crystals and Displays, 2024, 39(9): 1182

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    Paper Information

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    Received: Jun. 18, 2024

    Accepted: --

    Published Online: Nov. 13, 2024

    The Author Email: Chengyuan DONG (cydong@sjtu.edu.cn)

    DOI:10.37188/CJLCD.2024-0177

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