Chinese Journal of Liquid Crystals and Displays, Volume. 39, Issue 9, 1182(2024)
Improving circuit design for the stability of inverters based on amorphous indium gallium zinc oxide thin film transistors
Fig. 1. Comparison between simulation results and experimental data.(a)Transfer characteristic curves;(b)Stretched-exponential curve fitting.
Fig. 2. Circuit schematics of(a)traditional pseudo-CMOS inverter and(b)revised inverter.
Fig. 3. Improvement mechanism of the revised inverter:(a)Variation of VGS4 and VGS5 with the input voltage;(b)Variation of VGS4 with the stress time.
Fig. 4. Simulation comparison of the traditional pseudo-CMOS inverter and revised inverter.(a)VTC curves;(b)Response time;(c)Output swing and its stability;(d)Power and its stability;(e)Change Ratio of tLH;(f)Change ratio of tHL.
Fig. 5. Relationship between VPP and response time of the revised inverter and W1/W0
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Shu JIANG, Tianhao ZHANG, Xiaomin WEI, Liangdong LI, Chengyuan DONG. Improving circuit design for the stability of inverters based on amorphous indium gallium zinc oxide thin film transistors[J]. Chinese Journal of Liquid Crystals and Displays, 2024, 39(9): 1182
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Received: Jun. 18, 2024
Accepted: --
Published Online: Nov. 13, 2024
The Author Email: Chengyuan DONG (cydong@sjtu.edu.cn)