Fig. 1. Distribution diagram of the ellipticity of the outgoing light simulated according to the measured data

Fig. 2. Simulated overall angular ellipticity distribution of outgoing light after incident light at 45° poler angle

Fig. 3. Simulated ellipticity distribution of RQWP under the variation of NZ within the wavelength of incident light at 470，550，620 nm.

Fig. 4. Film on OLED screen，shot at a polar angle of 45°.（a）~（f）Shooting at different azimuth angles，135°，90°，45°，180°，0°，225°，270°，315°，respectively. A represents the RQWP；B represented the RQWP+LCC1，and C represented the RQWP+LCC2.

Fig. 5. （a）Schematic diagram of the test worktable；（b）Color coordinate diagram of reflected light on OLED screens with three film stacks at a 45° polar angle.

Fig. 6. Measured full-argument reflectivity of the OLED screen at a polar angle of 45°