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Spectroscopy and Spectral Analysis, Volume. 35, Issue 1, 252(2015)

The Study of Selecting Sample Detecting Position and Lead Plate Inner Material in Thin Film Method X-Ray Fluorescence Measurement

GAN Ting-ting*, ZHANG Yu-jun, ZHAO Nan-jing, YIN Gao-fang, DONG Xin-xin, WANG Ya-ping, LIU Jian-guo, and LIU Wen-qing
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    GAN Ting-ting, ZHANG Yu-jun, ZHAO Nan-jing, YIN Gao-fang, DONG Xin-xin, WANG Ya-ping, LIU Jian-guo, LIU Wen-qing. The Study of Selecting Sample Detecting Position and Lead Plate Inner Material in Thin Film Method X-Ray Fluorescence Measurement[J]. Spectroscopy and Spectral Analysis, 2015, 35(1): 252

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    Paper Information

    Received: Dec. 11, 2013

    Accepted: --

    Published Online: Jan. 28, 2015

    The Author Email: Ting-ting GAN (tingtinggan@163.com)

    DOI:10.3964/j.issn.1000-0593(2015)01-0252-06

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology