Chinese Optics Letters, Volume. 6, Issue 8, 597(2008)
A method of measuring the refractive index of extraordinary ray in uniaxial crystal with optic axis at an arbitrary orientation
References(7)
[1] [1] W. Feng, H. Lin, and L. Chen, Acta Opt. Sin. (in Chinese) 27, 1044 (2007).
[2] [2] A. Yariv, Quantum Electronics (in Chinese) S. Liu, C. Wu, M. Wang (trans.) (Shanghai Scientific and Technical Press, Shanghai, 1982) p.93.
[3] [3] Z. Shao, Phys. Rev. E 51, 1043 (1995).
[4] [4] M. C. Simon and R. M. Echarri, Appl. Opt. 25, 1935 (1986).
[5] [5] Z. Shao and C. Yi, Appl. Opt. 33, 1209 (1994).
[6] [6] M. C. Simon, Appl. Opt. 22, 354 (1983).
[7] [7] W. Shen and Z. Shao, Acta Opt. Sin. (in Chinese) 22, 765 (2002).
Cited By
Tools
Get Citation
Copy Citation Text
Yongxing Jin, Zhongxing Shao, "A method of measuring the refractive index of extraordinary ray in uniaxial crystal with optic axis at an arbitrary orientation," Chin. Opt. Lett. 6, 597 (2008)
Paper Information
Received: Jan. 2, 2008
Accepted: --
Published Online: Sep. 2, 2008
The Author Email:
© Copyright 2018-2021 | Chinese Laser Press.
All Rights Reserved 沪ICP备15018463号-20