Journal of Applied Optics, Volume. 44, Issue 3, 621(2023)
Surface defect detection of patch diode based on improved YOLO-V4
Fig. 7. Curves of average loss rate and average detection accuracy
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Liequan WU, Zhifeng ZHOU, Zhiling ZHU, Wei ZHANG, Yong WANG. Surface defect detection of patch diode based on improved YOLO-V4[J]. Journal of Applied Optics, 2023, 44(3): 621
Category: Research Articles
Received: Jun. 13, 2022
Accepted: --
Published Online: Jun. 19, 2023
The Author Email: Zhifeng ZHOU (zhousjtu@126.com)