Journal of Applied Optics, Volume. 44, Issue 3, 621(2023)

Surface defect detection of patch diode based on improved YOLO-V4

Liequan WU1, Zhifeng ZHOU1、*, Zhiling ZHU1, Wei ZHANG2, and Yong WANG3
Author Affiliations
  • 1School of Mechanical and Automotive Engineering, Shanghai University of Engineering Science, Shanghai 201620, China
  • 2Shanghai Compass Satellite Navigation Technology Co.,Ltd., Shanghai 201801, China
  • 3State Grid Siji Location Service Co.,Ltd., Beijing 102211, China
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    Figures & Tables(9)
    Algorithm framework of YOLO-V4
    Algorithm framework of improved YOLO-V4
    Basic residual module
    Improved DenseBlock structure
    Improved CSP2 structure
    Three-branch mixed attention mechanism
    Curves of average loss rate and average detection accuracy
    Test results of part of images in test set on algorithm
    • Table 1. Performance indicators of various models

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      View in Article

      Table 1. Performance indicators of various models

      Network modelP/%R/%mAP/%FPs
      SSD88.6191.7089.4753
      YOLO-V391.7993.2192.1050
      YOLO-V495.2197.3596.5358
      Improved YOLO-V498.16100.0099.4555
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    Liequan WU, Zhifeng ZHOU, Zhiling ZHU, Wei ZHANG, Yong WANG. Surface defect detection of patch diode based on improved YOLO-V4[J]. Journal of Applied Optics, 2023, 44(3): 621

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    Paper Information

    Category: Research Articles

    Received: Jun. 13, 2022

    Accepted: --

    Published Online: Jun. 19, 2023

    The Author Email: Zhifeng ZHOU (zhousjtu@126.com)

    DOI:10.5768/JAO202344.0303007

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