Chinese Optics Letters, Volume. 5, Issue s1, 237(2007)

Optical gauge block metrology in KRISS

Chu-Shik Kang, Jae Wan Kim, Jong-Ahn Kim, Ho Suhng Suh, and Won-Kyu Lee
Author Affiliations
  • Length/Time Metrology Group, Physical Metrology Division, Korea Research Institute of Standards and Science, Daejeon 305-340, Korea
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    References(11)

    [1] [1] ISO 3650:1998(E) GPS-Length standards-Gauge blocks (1998).

    [2] [2] M. Born and E. Wolf, Principles of Optics (6th edn.) (Pergamon, New York, 1980).

    [3] [3] E. Ikonen and K. Riski, Metrologia 30, 95 (1993).

    [4] [4] Y. Bitou and K. Seta, Jpn. J. Appl. Phys. 39, 6084 (2000).

    [5] [5] C.-S. Kang, J. W. Kim, H. S. Suh, and W.-K. Lee, Proc. SPIE 5879, 5 (2005).

    [6] [6] T. J. Quinn, Metrologia 36, 211 (1999).

    [7] [7] J. Ye, S. Swartz, P. Jungner, and J. L. Hall, Opt. Lett. 21, 1280 (1996).

    [8] [8] G. Boensch and E. Potulski, Proc. SPIE 3477, 62 (1998).

    [9] [9] C.-S. Kang, S. E. Lee, K. S. Gam, and M. J. Kim, Sae-Mulli 41, 22 (2000).

    [10] [10] J. Decker and J. Pekelsky, Gauge Block Calibration by Optical Interferometry at the National Research Council of Canada, NRC Doc. No. 40002 (1997).

    [11] [11] Guide to the Expression of Uncertainty in Measurement, (1st edn.) ISO, Geneva (1993).

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    Chu-Shik Kang, Jae Wan Kim, Jong-Ahn Kim, Ho Suhng Suh, Won-Kyu Lee, "Optical gauge block metrology in KRISS," Chin. Opt. Lett. 5, 237 (2007)

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    Paper Information

    Received: Jan. 1, 1949

    Accepted: --

    Published Online: Jul. 15, 2007

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