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Acta Optica Sinica, Volume. 22, Issue 10, 1224(2002)

A Diffractive Long Trace Profiler for Large Aspherical Optics

[in Chinese]1, [in Chinese]1, [in Chinese]1、*, [in Chinese]2, and [in Chinese]2
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  • 2[in Chinese]
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    [1] [1] Hills. High heat load synchrotron optics. Proc. SPIE, 1992, 1739:456～463

    [2] [2] Anthony. High heat load optics: On historical overview. Opt. Engng., 1995, 34(2):313～320

    [3] [3] Sostero G, Cocco D, Qian S N. Metrological challenges of synchrotron radiation optics. Proc. SPIE, 1999, 3739:310～316

    [4] [4] Weingartner I, Schulz M, Elster C. Novel scanning technique for ultraprecise measurement of topography. Proc. SPIE, 1999, 3782:306～317

    [5] [5] Yu Jingchi, Xu Jinqiang, Zhang Xuejun et al.. Surface contour measurement using an optical scanner. Proc. SPIE, 1995, 2536:192～199

    [6] [6] Von Bieren. Pencil beam interferometer for aspherical optical surfaces. Proc. SPIE, 1982, 343:101～108

    [7] [7] Takacs P Z, Qian S N, Colbert J. Design of a long trace surface profiler. Proc. SPIE, 1987, 749:59～64

    [8] [8] Steve Irick. Long trace profiler survey results. Proc. SPIE, 1999, 3782:275～282

    [9] [9] Goodman J W. Introduction of Fourier Optics. San Francisco: McGraw-Hill, 1968. 61～62

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    [2] Dagang Huang, Heng Zhang, Shah-Rong Lee, Baoguang Wang, "Shape measurement of aspheric plastic lens with large angle," Chin. Opt. Lett. 3, 09516 (2005)

    [3] Ma Chuntao, Luo Hongxin, Wang Jie, Song Li. Surface Error Measurement of Plane Mirrors Based on Oblique Incidence[J]. Laser & Optoelectronics Progress, 2011, 48(7): 71201

    [4] Liu Dong, Yang Yongying, Tian Chao, Weng Junmiao, Zhuo Yongmo, Yang Liming. Analysis and Correction of Retrace Error for Nonnull Aspheric Testing[J]. Acta Optica Sinica, 2009, 29(3): 688

    [5] Zhu Shou, Zhang Xiaohui. Analysis and Verification for Accuracy of Ritchey Angle in Flat Mirror Test[J]. Acta Optica Sinica, 2013, 33(6): 612001

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    [7] Li Shun, Gong Yan. Error Analysis and Correction during Measurement of Tube-Shaped Super-Smooth Mirrors Using Long Trace Profiler[J]. Acta Optica Sinica, 2011, 31(11): 1112001

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    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. A Diffractive Long Trace Profiler for Large Aspherical Optics[J]. Acta Optica Sinica, 2002, 22(10): 1224

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Feb. 4, 2001

    Accepted: --

    Published Online: Aug. 8, 2006

    The Author Email: (ldc-dpi@mail.tsinghua.edu.cn)

    DOI:

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology