NUCLEAR TECHNIQUES, Volume. 48, Issue 4, 040203(2025)
Matrix correction method for nuclear material mass measurement using Shuffler neutron interrogation system
Fig. 1. Diagram of simulation model of WM3210 PAN Shuffler system (a) Side view, (b) Top view
Fig. 2. Schematic illustration of WM3210 PAN Shuffler system (a) Background count measurement, (b) Transfer and irradiation of interrogation source, (c) Return of interrogation source and delayed neutron counting
Fig. 3. For the 93.2%-enriched U3O8 material, the variation trend of the unit 235U mass delayed neutron count rate (
Fig. 4. An average relative deviation in the mass of 235U when the U3O8 material as located at the center of the matrix (a) 0.7%-enriched U3O8 material, (b) 2%-enriched U3O8 material, (c) 3%-enriched U3O8 material
Fig. 5. An average relative deviation in mass of 235U when U3O8 is homogeneously dispersed throughout the matrix (a) 0.7%-enriched U3O8, (b) 2%-enriched U3O8, (c) 3%-enriched U3O8
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Jinlong YONG, Yushou SONG, Yunlong ZHAO, Yingwei HOU, Huilan LIU. Matrix correction method for nuclear material mass measurement using Shuffler neutron interrogation system[J]. NUCLEAR TECHNIQUES, 2025, 48(4): 040203
Category: ACCELERATOR, RAY TECHNOLOGY AND APPLICATIONS
Received: Apr. 10, 2024
Accepted: --
Published Online: Jun. 3, 2025
The Author Email: Yushou SONG (宋玉收)