Fig. 1. Optical geometry of measurement system

Fig. 2. (a) Daughter wavelets with different scales; (b) Fourier spectra of daughter wavelets; (c) mother wavelets with different fb values; (d) Fourier spectra of mother wavelets

Fig. 3. (a) Deformed fringe pattern without noise; (b) wavelet ridges with different fb values; (c) unwrapped phase of Fig. 3(b); (d) wavelet ridges when fb is equal to 0.2; (e) unwrapped phase of Fig. 3(d)

Fig. 4. (a) Deformed fringe pattern considering random noise with mean square deviation of 0.20; (b) wavelet ridges with different fb values; (c) unwrapped phase of Fig. 4(b); (d) wavelet ridges introducing improved wavelet processing method; (e) unwrapped phase of improved wavelet processing method

Fig. 5. (a) Simulated object; (b) deformed fringe pattern

Fig. 6. Error distribution without noise. (a) fb=0.5; (b) fb=1.0; (c) fb=1.5; (d) fb=2.0

Fig. 7. Error considering random noise influence with mean square deviation of 0.20.(a) fb=0.5; (b) fb=1.0; (c) fb=1.5; (d) fb=2.0

Fig. 8. Results and error distribution considering random noise with mean square deviation of 0.20. (a) Reconstruction results by improved wavelet processing method; (b) reconstruction error distribution by improved wavelet processing method; (c) error distribution by method proposed by Liu et al.[8]

Fig. 9. (a) Deformed fringe with low noise; (b) fringe distribution of the 381th row in Fig. 9(a)

Fig. 10. (a) Unwrapped phase by employing improved wavelet processing method; (b) unwrapped phase of the 381th row of deformed fringe pattern

Fig. 11. (a) Deformed fringe pattern with high noise level; (b) fringe distribution of the 286th row in Fig. 11(a)

Fig. 12. (a) Wrapped phase when fb=1.0; (b) wrapped phase when fb=2.0; (c) unwrapped phase when fb=1.0; (d) unwrapped phase when fb=2.0; (e) wrapped phase extracted by method proposed by Liu et al.[8]; (f) wrapped phase extracted by improved wavelet processing method; (g) unwrapped phase extracted by method proposed by Liu et al[8]; (h) unwrapped phase extracted by improved wavelet processing method