Time delay signature concealment of chaotic semiconductor laser subject to nonlinear feedback

Chenpeng Xue; Ning Jiang; Yunxin Lv; Kun Qiu

doi:10.3788/COL201614.091404

Chinese Optics Letters, Volume. 14, Issue 9, 091404(2016)

Time delay signature concealment of chaotic semiconductor laser subject to nonlinear feedback

Chenpeng Xue, Ning Jiang^*, Yunxin Lv, and Kun Qiu

Key Laboratory of Optical Fiber Sensing and Communications, Ministry of Education, University of Electronic Science and Technology of China, Chengdu 611731, China

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References(29)

[1] T. Matsuura, A. Uchida, S. Yoshimori. Opt. Lett., 29, 2731(2004).

[2] A. Argyris, D. Syvridis, L. Larger, V. Annovazzi-Lodi, P. Colet, I. Fischer, J. Garcla-Ojalvo, C. R. Mirasso, L. Pesquera, K. A. Shore. Nature, 438, 343(2005).

[3] Y. Hong, M. W. Lee, J. Paul, P. S. Spencer, K. A. Shore. IEEE J. Lightwave Technol., 27, 5099(2009).

[4] N. Jiang, C. Zhang, K. Qiu. Opt. Lett., 37, 4501(2012).

[5] A. Uchida, K. Amano, M. Inoue, K. Hirano, S. Naito, H. Someya, I. Oowada, T. Kurashige, M. Shiki, S. Yoshimori, K. Yoshimura, P. Davis. Nat. Photon., 2, 728(2008).

[6] I. Kanter, Y. Aviad, I. Reidler, E. Cohen, M. Rosenbluh. Nat. Photon., 4, 58(2010).

[7] A. Wang, P. Li, J. Zhang, J. Zhang, L. Li, Y. Wang. Opt. Express, 21, 20452(2014).

[8] R. Sakuraba, K. Iwakawa, K. Kanno, A. Uchida. Opt. Express, 23, 1470(2015).

[9] F. Y. Lin, J. M. Liu. IEEE J. Quantum Electron., 40, 682(2004).

[10] W. T. Wu, Y. H. Liao, F. Y. Lin. Opt. Express, 18, 26155(2010).

[11] Y. Wang, B. Wang, A. Wang. IEEE Photon. Technol. Lett., 20, 1636(2008).

[12] R. Hegger, M. J. Bünner, H. Kantz, A. Giaquinta. Phys. Rev. Lett., 81, 558(1998).

[13] Y. Wu, Y. Wang, P. Li, A. Wang. IEEE J. Quantum Electron., 48, 1371(2012).

[14] D. Rontani, A. Locquet, M. Sciamanna, D. S. Citrin, S. Ortin. IEEE J. Quantum Electron., 45, 879(2009).

[15] L. Zunino, M. C. Soriano, I. Fischer, O. A. Rosso, C. R. Mirasso. Phys. Rev. E, 82, 046212(2010).

[16] R. M. Nguimdo, M. C. Soriano, P. Colet. Opt. Lett., 36, 4332(2011).

[17] D. Rontani, A. Locquet, M. Sciamanna, D. S. Citrin. Opt. Lett., 32, 2960(2007).

[18] J. Wu, G. Xia, Z. Wu. Opt. Express, 17, 20124(2009).

[19] R. M. Nguimdo, G. Verschaffelt, J. Danckaert, G. Van der Sande. Opt. Lett., 37, 2541(2012).

[20] S. Li, Q. Liu, S. Chan. IEEE Photon. J., 4, 1930(2012).

[21] S. Priyadarshi, Y. Hong, I. Pierce, K. A. Shore. IEEE J. Sel. Top. Quantum Electron., 19, 1700707(2013).

[22] S. Xiang, W. Pan, A. Wen, N. Li, L. Zhang, L. Shang, H. Zhang. IEEE Photon. Technol. Lett., 25, 1398(2013).

[23] X. Dou, C. Wu, X. Chen, H. Yin, Q. Zhao, Y. Hao, N. Zhao. Chin. Opt. Lett., 12, S10610(2014).

[24] M. Cheng, X. Gao, L. Deng, L. Liu, Y. Deng, S. Fu, M. Zhang, D. Liu. IEEE Photon. Technol. Lett., 27, 1030(2015).

[25] L. Yang, W. Pan, L. Yan, B. Luo, P. Mu, N. Li. Chin. Opt. Lett., 13, 041403(2015).

[26] A. Wang, Y. Yang, B. Wang, B. Zhang, L. Li, Y. Wang. Opt. Express, 21, 8701(2013).

[27] R. Lang, K. Kobayashi. IEEE J. Quantum Electron., 16, 347(1980).

[28] R. Vicente, C. R. Mirasso, I. Fischer. Opt. Lett., 32, 403(2007).

[29] C. Xue, N. Jiang, K. Qiu, Y. Lv. Opt. Express, 23, 14510(2015).

CLP Journals

[1] Yongrui Guo, Huadong Lu, Qiwei Yin, Jing Su, "Intra-cavity round-trip loss measurement of all-solid-state single-frequency laser by introducing extra nonlinear loss," Chin. Opt. Lett. 15, 021402 (2017)

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Chenpeng Xue, Ning Jiang, Yunxin Lv, Kun Qiu, "Time delay signature concealment of chaotic semiconductor laser subject to nonlinear feedback," Chin. Opt. Lett. 14, 091404 (2016)

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Paper Information

Category: Lasers and Laser Optics

Received: May. 24, 2016

Accepted: Jul. 19, 2016

Published Online: Aug. 3, 2018

The Author Email: Ning Jiang (uestc_nj@uestc.edu.cn)

DOI:10.3788/COL201614.091404

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology