Chinese Optics Letters, Volume. 2, Issue 9, 09552(2004)

An optical method for wavelength fine-selection in optical spectrum analysers

Tingdi Liao1,2、*, Yishen Qiu1,2, and Huizhen Xu1,2
Author Affiliations
  • 1School of Physics &
  • 2Optoelectronics Technology, Fujian Normal University, Fuzhou 350007
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    References(6)

    [1] [1] G. Levesque (EXFO), Photonics Spectra 34, 106 (2000).

    [2] [2] S. V. Kartalopoulos, DWDM: Networks, Devices, and Technology (Wiley-IEEE Press, 2002).

    [3] [3] K. R. Wildnauer and Z. Azary, Hewlett-Packard Journal 44, 68 (1993).

    [4] [4] Yokogawa Electronic Corporation (Japan), "Optical spectrum analyser and spectroscope" International Patent Number WO9628713A1 (1996).

    [5] [5] Oxford Fibre Optics Tools Ltd. (UK), "Optical spectrum analyser" International Patent Application Number PCT/GB00/00496 (1999).

    [6] [6] T. D. Liao and R. Chaney, "Wavelength tuning in external cavity lasers" International Patent WO 01/73905 (October 4, 2001).

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    Tingdi Liao, Yishen Qiu, Huizhen Xu, "An optical method for wavelength fine-selection in optical spectrum analysers," Chin. Opt. Lett. 2, 09552 (2004)

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    Paper Information

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    Received: Apr. 23, 2004

    Accepted: --

    Published Online: Jun. 6, 2006

    The Author Email: Tingdi Liao (xianwenfz@163.com)

    DOI:

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