Photonics Research, Volume. 13, Issue 4, 845(2025)
Scattering correction through Fourier-domain intensity coupling in two-photon microscopy (2P-FOCUS)
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Daniel Zepeda, Yucheng Li, Yi Xue, "Scattering correction through Fourier-domain intensity coupling in two-photon microscopy (2P-FOCUS)," Photonics Res. 13, 845 (2025)
Category: Imaging Systems, Microscopy, and Displays
Received: Oct. 14, 2024
Accepted: Dec. 30, 2024
Published Online: Mar. 10, 2025
The Author Email: Yi Xue (yxxue@ucdavis.edu)
CSTR:32188.14.PRJ.544387