OPTICS & OPTOELECTRONIC TECHNOLOGY, Volume. 22, Issue 5, 45(2024)
Defect Detection on Power Lines Based on Edge Technology and Deep Network
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LU Xiao, WU Qiang, JIANG Cheng-ling, MA Zhou-jun, WANG Mao-fei, SHAN Hua. Defect Detection on Power Lines Based on Edge Technology and Deep Network[J]. OPTICS & OPTOELECTRONIC TECHNOLOGY, 2024, 22(5): 45
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Received: Jan. 24, 2024
Accepted: Jan. 21, 2025
Published Online: Jan. 21, 2025
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CSTR:32186.14.