Laser & Optoelectronics Progress, Volume. 58, Issue 17, 1732001(2021)
Heavy Ion Single Event Effect Test Calibration System
Figures & Tables(11)
Fig. 6. Flip distribution of C ion irradiation at different incident angles (test data is 00). (a) Incident angle is 0; (b) incident angle is 45°; (c) incident angle is 60°
Fig. 7. Flip distribution of C ion irradiation at different incident angles (test datas is FF). (a) Incident angle is 0; (b) incident angle is 45°; (c) incident angle is 60°
Fig. 8. Single particle flip distribution of Kr ion irradiation. (a) Incident angle is 0, and test data is 00; (b) incident angle is 0, and test data is FF
Table 1. Functional design of software
View tableTable 1. Functional design of software
Module Description Serial control Set serial port parameters Serial receiving and sending Send and receive data by serial port Reading and writing Write data to the disk and data stream mode read Chart drawing Draw curve graphs and scatter plots under XY coordinates Error statistics Compare with the initial vector and count the number of errors Section calculation Calculate the cross section Write to vector Send commands to the calibration system to achieve write operations to the target device Read data Send commands to the calibration system，the calibration system is used to read the target device data，and the PC is uesd to save the returned data Current and voltage monitoring Display the voltage and current data sent back Input Enter the radiation source information，including particle type，energy，etc.，and save it Transfer Inquire，select and other operations to obtain the entered radiation source information Calibration system reference data display Draw the reference data curve of the calibration system Field data annotation Calculate the field cross-section and standardize it in the graph Addition，deletion，and modification Manage the calibration data of the radiation source that has been verified to be correct，including data addition，deletion，and modification Calibration data query Inquire or display historical calibration data
Table 2. Summary of single particle irradiation test data[7-8]
View tableTable 2. Summary of single particle irradiation test data[7-8]
Ion Angle /（°） LET /（MeV·cm2·mg-1） Data mode Fluence rate /（cm-2·s-1） Fluence /cm-2 Experimentphenomenon Wrong number Cross section size per 1 bit /cm2 C 0 1.73 00 9.50×103 1.00×106 SEU 96 6.00×10-12 C 0 1.73 FF 9.50×103 1.00×106 SEU 97 6.06×10-12 C 45 2.45 00 9.50×103 5.00×105 SEU 96 1.20×10-11 C 45 2.45 FF 9.50×103 5.00×105 SEU 71 8.88×10-12 C 60 3.46 00 9.50×103 2.50×105 SEU 177 4.43×10-11 C 60 3.46 FF 9.50×103 2.50×105 SEU 126 3.15×10-11 F 0 4.70 FF 1.10×104 1.00×106 SEU 115689 7.23×10-9 F 0 4.70 00 1.10×104 1.00×105 SEU 13453 8.41×10-9 F 0 4.70 FF 4.80×103 1.00×105 SEU 11983 7.49×10-9 F 45 6.60 00 4.80×103 5.00×104 SEU 8834 1.10×10-8 F 45 6.60 FF 4.80×103 5.00×104 SEU 7837 9.80×10-9 F 60 9.40 00 4.80×103 2.50×104 SEU 5923 1.48×10-8 F 60 9.40 FF 4.80×103 2.50×104 SEU 5788 1.45×10-8 I 0 65.60 00 5.00×102 1.00×104 SEU 10466 6.54×10-8 I 0 65.60 FF 5.00×102 1.00×104 SEU 7053 4.41×10-8 I 45 92.80 00 5.00×102 5.00×103 SEU 5077 6.35×10-8 I 45 92.80 FF 5.00×102 5.00×103 SEU 4182 5.23×10-8 I 60 131.20 00 5.00×102 5.00×103 SEU 5284 6.61×10-8 I 60 131.20 FF 1.00×103 5.00×103 SEU 4917 6.15×10-8 Li 0 0.44 00 2.30×104 2.00×106 SEU 17 5.31×10-13 Li 0 0.44 FF 2.30×104 2.00×106 SEU 16 5.00×10-13 Li 45 0.62 00 2.30×104 1.00×106 SEU 7 4.38×10-13 Li 45 0.62 FF 2.30×104 1.00×106 SEU 6 3.75×10-13 Li 60 0.88 00 2.30×104 5.00×105 SEU 3 3.75×10-13 Li 60 0.88 FF 2.30×104 5.00×105 SEU 7 8.75×10-13 O 0 3.10 00 1.30×103 1.00×105 SEU 1290 8.06×10-10 O 0 3.10 FF 1.30×103 1.00×105 SEU 617 3.86×10-10 O 0 3.10 FF 1.30×103 1.00×105 SEU 505 3.16×10-10 O 45 4.40 00 1.30×103 1.00×105 SEU 11811 7.38×10-9 O 45 4.40 FF 1.30×103 1.00×105 SEU 6275 3.92×10-9 O 60 6.20 00 1.30×103 1.00×105 SEU 13704 8.57×10-9 O 60 6.20 FF 1.30×103 1.00×105 SEU 11295 7.06×10-9 Si 0 9.00 00 3.90×102 5.00×104 SEU 22008 2.75×10-8 Si 0 9.00 FF 3.90×102 5.00×104 SEU 17522 2.19×10-8 Si 45 12.70 00 3.90×102 5.00×104 SEU 26423 3.30×10-8 Si 45 12.70 FF 3.90×102 3.00×104 SEU 19059 3.97×10-8 Si 60 18.00 00 3.90×102 3.00×104 SEU 17114 3.57×10-8 Si 60 18.00 FF 3.90×102 3.00×104 SEU 16832 3.51×10-8 Ge 0 37.30 00 2.50×104 1.50×106 SEU 746791 3.11×10-8 Ge 0 37.30 FF 1.35×104 8.10×105 SEU 338616 2.61×10-8 Ge 0 37.30 00 1.28×103 7.70×104 SEU 38440 3.12×10-8 Ge 0 37.30 FF 1.42×103 8.50×104 SEU 38048 2.80×10-8 Ti 0 21.84 00 1.90×103 1.20×105 SEU 32736 1.70×10-8 Ti 0 21.84 FF 1.80×103 1.10×105 SEU 29474 1.70×10-8 Cl 0 13.40 00 1.70×103 1.00×105 SEU 23844 1.50×10-8 Cl 0 13.40 FF 5.00×102 3.00×104 SEU 6816 1.42×10-8 Ta 0 81.35 00 1.01×104 1.01×106 SEU 78848 6.19×10-8 Kr 0 20.30 FF 2.50×104 1.01×106 SEU 22010 1.31×10-8 Kr 0 20.30 00 2.50×104 1.01×106 SEU 22824 1.35×10-8
Table 3. Comparison of single particle flip cross section data
View tableTable 3. Comparison of single particle flip cross section data
Ion This paper CIAE ESA LET /（MeV·cm2·mg-1） Cross section size per 1 bit /cm2① LET /（MeV·cm2·mg-1） Cross section size per 1 bit /cm2 Error /% LET /（MeV·cm2·mg-1）② Cross section size per 1 bit /cm2② Error /% Li 0.44 5.16×10-13 — — — — — — Li 0.62③ 4.07×10-13 — — — — — — Li 0.88④ 6.25×10-13 — — — — — — C 1.73 6.03×10-12 1.8 4.90×10-12 18.74 1.68⑤ 1.46×10-11⑥ 142.12 C 2.45③ 1.04×10-11 2.5③ 1.00×10-11 3.85 2.34⑤ 2.68×10-11⑥ 157.69 C 3.46④ 3.79×10-11 3.6④ 4.67×10-11 23.22 — — — O 3.10 5.96×10-10 — — — 3.03⑤ 9.42×10-10⑥ 58.05 O 4.40③ 5.65×10-9 4.3 5.37×10-9 4.96 4.55⑤ 4.54×10-9⑥ 19.65 O 6.20④ 7.82×10-9 6.2③ 7.07×10-9 9.59 6.29⑤ 7.11×10-9⑥ 9.08 F 4.70 7.95×10-9 — — — — — — F 6.60③ 1.04×10-8 — — — — — — F 9.40④ 1.47×10-8 8.8④ 1.03×10-8 29.93 9.97⑤ 1.53×10-8⑥ 4.08 Si 9.00 2.47×10-8 — — — — — — Si 12.70③ 3.64×10-8 — — — 13.86⑤ 1.98×10-8⑥ 45.60 Si 18.00④ 3.54×10-8 — — — 20.34⑤ 2.39×10-8⑥ 32.49 Cl 13.40 1.46×10-8 13.8 1.93×10-8 — — — — Kr 20.30 1.34×10-8 20.9 2.30×10-8 71.60 — — — Ti 21.84 1.70×10-8 20.9 2.30×10-8 35.30 — — — Ge 37.00 2.28×10-8 33.5 3.14×10-8 37.70 — — — Ge 37.30 2.91×10-8 33.5 3.14×10-8 7.90 — — — Ge 52.30③ 3.28×10-8 — — — — — — I 65.60 5.48×10-8 67.4④ 4.99×10-8 8.94 64.40⑤ 6.79×10-8⑥ 23.91 Ta 81.35 6.19×10-8 — — — — — — Ta 92.80③ 5.79×10-8 — — — — — — Ta 131.20④ 6.38×10-8 — — — 111.92⑤ 1.08×10-7⑥ 69.28
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Haolin Liu, Qing Liu, Xiaohui Zhang, Jing Sun, Song Gu, Zhengyu Zhong. Heavy Ion Single Event Effect Test Calibration System[J]. Laser & Optoelectronics Progress, 2021, 58(17): 1732001
Paper Information
Category: Ultrafast Optics
Received: Feb. 24, 2021
Accepted: Mar. 23, 2021
Published Online: Sep. 14, 2021
The Author Email: Haolin Liu (821137104@qq.com)
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