Chinese Journal of Lasers, Volume. 51, Issue 23, 2304001(2024)

Surface Topography Measurement for Large-Scale Sputter Crater with Glow Discharge Spectrometry Based on SD-OCT

Zhenzhen Wan1, Shaofeng Liu1, Ning Shi1、*, Yixuan Shen2、**, Yaning Zhao1, Peng Xiong1, and Yongqing Wang1
Author Affiliations
  • 1Key Laboratory of Digital Medical Engineering of Hebei Province, College of Electronic and Information Engineering, Hebei University, Baoding 071002, Hebei , China
  • 2Materials Service Safety Assessment Facilities, University of Science and Technology Beijing, Beijing 100083, China
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    Figures & Tables(18)
    Flow chart of glow-discharge large-size sputtering crater surface topography detection method based on SD-OCT
    SD-OCT system structure
    B-scan images of sputtering crater under SD-OCT system. (a) Left part of crater; (b) central part of crater; (c) right part of crater
    Flow of data peak search and denoising
    Schematic of data peak search
    Contour of each part of crater depth reconstructed based on SD-OCT detection algorithm. (a) Left part of crater; (b) central part of crater; (c) right part of crater
    Crater depth profiles before and after correction. (a) Before correction; (b) after correction
    Crater depth sections with different diameters reconstructed based on SD-OCT detection algorithm. (a) 15 mm; (b) 20 mm; (c) 30 mm; (d) 40 mm
    Comparison of different sputtering crater profiles under different methods. (a1)(a2) No. 1 zinc-copper sample; (b1)(b2) No. 2 zinc-copper sample; (c1)(c2) No. 3 zinc-copper sample; (d1)(d2) No. 4 zinc-copper sample
    Comparison of detection results between SD-OCT detection method and white light interferometer
    Standard working curves. (a) Zn; (b) Fe
    Spectral intensities and mass fractions of Fe and Zn in galvanized sheet samples versus time. (a) Intensity; (b) mass fraction
    • Table 1. Comparison among SD-OCT and commonly used surface topography detection instruments

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      Table 1. Comparison among SD-OCT and commonly used surface topography detection instruments

      ParameterContour X-500Dektake XTGanymede-II SD-OCT
      Field of view3.0 mm×2.5 mm≤4 mm6 mm×6 mm
      Vertical resolution<0.01 nm≤0.1 nm1.88 μm
      Horizontal resolution0.38 μm1 μm1.46 μm
      Measurement technologyNon-contactContactNon-contact
      Market priceHighMiddleLow
    • Table 2. Measurement accuracy of glow-discharge sputtering crater depth based on SD-OCT

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      Table 2. Measurement accuracy of glow-discharge sputtering crater depth based on SD-OCT

      Group No.Sputtering crater depth of purple copper /μmSputtering crater depth of brass /μmSputtering crater depth of stainless steel /μmSputtering crater depth of galvanized plate /μm
      140.9557.9415.7316.90
      240.2258.8215.4616.68
      341.4057.8115.2616.31
      441.5059.0715.3415.99
      541.4259.1214.7816.51
      641.5258.8015.9016.89
      740.2157.9714.9516.78
      Average41.0358.5015.3516.58
      Standard deviation0.590.570.400.34
      RSD /%1.440.982.592.02
    • Table 3. Comparison of sputtering rate data measured by SD-OCT detection method and white light interferometer

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      Table 3. Comparison of sputtering rate data measured by SD-OCT detection method and white light interferometer

      SampleWhite light interferometerSD-OCT detection algorithm

      Relative error

      rate of depth /%

      Depth /μmSputtering rate /(μm·min-1Depth /μmSputtering rate /(μm·min-1
      Galvanized plate10.110.5110.230.51+1.19
      Galvanized plate11.540.5811.130.56-3.55
      Galvanized plate11.550.5811.780.59+1.99
      Galvanized plate12.930.6512.670.63-2.01
      Stainless steel19.880.9919.091.00-3.97
      Stainless steel19.941.0019.240.96-3.51
      Purple copper44.822.2444.402.22-0.94
      Purple copper48.132.4147.042.35-2.26
      Brass61.653.0863.053.15+2.27
    • Table 4. Density value and sputtering mass measurement result of each standard sample

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      Table 4. Density value and sputtering mass measurement result of each standard sample

      Standard sampleSample density ρ /(g·cm-3Sputtering depth h /μmSputtering mass m /mg
      Zinc alloy 41XGLV97.1145.19227.02
      Copper alloy H598.4051.61306.28
      Copper-zinc alloy BS675B8.2343.05250.31
      Copper alloy H628.4345.38279.89
      Super-alloy YSBS35504-20179.0786.50554.26
      Super-alloy YSBS35503-20179.0998.66633.58
      Super-alloy BS718D8.3165.77386.13
      Micro-alloyed steel GSB-03-20287.9361.24343.07
      Stainless steel YSBS11373C7.8453.97298.92
      Stainless steel 2Cr13-17-37.8549.95277.02
      Micro-alloyed steel GSB-03-24537.8657.59319.82
    • Table 5. Sputtering rate of each standard sample measured by density-depth method

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      Table 5. Sputtering rate of each standard sample measured by density-depth method

      Standard sampleSputtering time t /min

      Absolute sputtering rate /

      (mg·s-1

      Relative sputtering rate /

      (mg·s-1

      Zinc alloy 41XGLV9100.380.24
      Copper alloy H59100.510.18
      Copper-zinc alloy BS675B100.420.22
      Copper alloy H62100.470.19
      Super-alloy YSBS35504-2017600.150.28
      Super-alloy YSBS35503-2017600.180.51
      Super-alloy BS718D600.110.84
      Micro-alloyed steel GSB-03-2028600.100.94
      Stainless steel YSBS11373C600.081.08
      Stainless steel 2Cr13-17-3600.081.17
      Micro-alloyed steel GSB-03-2453600.091.00
    • Table 6. Standard working curve equations and correlation coefficients of zinc and iron elements

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      Table 6. Standard working curve equations and correlation coefficients of zinc and iron elements

      Element

      Standard working

      curve equation

      Correlation coefficient
      Zny=0.005x+8.1900.999
      Fey=0.011x-2.0890.998
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    Zhenzhen Wan, Shaofeng Liu, Ning Shi, Yixuan Shen, Yaning Zhao, Peng Xiong, Yongqing Wang. Surface Topography Measurement for Large-Scale Sputter Crater with Glow Discharge Spectrometry Based on SD-OCT[J]. Chinese Journal of Lasers, 2024, 51(23): 2304001

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    Paper Information

    Category: Measurement and metrology

    Received: Jan. 30, 2024

    Accepted: Apr. 29, 2024

    Published Online: Dec. 11, 2024

    The Author Email: Shi Ning (shiningzhongguo@126.com), Shen Yixuan (d202210553@xs.ustb.edu.cn)

    DOI:10.3788/CJL240552

    CSTR:32183.14.CJL240552

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