Chinese Optics Letters, Volume. 8, Issue s1, 170(2010)
Determination of fine layer structure in Ni/C multilayer using soft X-ray resonant reflectivity
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Songwen Deng, Hongji Qi, Chaoyang Wei, Kui Yi, Zhengxiu Fan, Jianda Shao, "Determination of fine layer structure in Ni/C multilayer using soft X-ray resonant reflectivity," Chin. Opt. Lett. 8, 170 (2010)
Received: Nov. 30, 2009
Accepted: --
Published Online: May. 14, 2010
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