Chinese Optics Letters, Volume. 8, Issue s1, 170(2010)

Determination of fine layer structure in Ni/C multilayer using soft X-ray resonant reflectivity

Songwen Deng1,2, Hongji Qi1, Chaoyang Wei1, Kui Yi1, Zhengxiu Fan1, and Jianda Shao1
Author Affiliations
  • 1Optical Films Technology R &
  • 2D Center, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China
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    CLP Journals

    [1] Xiaocong Yuan, Yuquan Zhang, Rui Cao, Xing Zhao, Jing Bu, Siwei Zhu, "Dynamic steering beams for efficient force measurement in optical manipulation," Chin. Opt. Lett. 9, 031201 (2011)

    [2] Gao Hongfang, Ren Yuxuan, Liu Weiwei, Li Yinmei. Rotation Dynamics of Yeast Cell in Vortex Optical Tweezers[J]. Chinese Journal of Lasers, 2011, 38(4): 404002

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    Songwen Deng, Hongji Qi, Chaoyang Wei, Kui Yi, Zhengxiu Fan, Jianda Shao, "Determination of fine layer structure in Ni/C multilayer using soft X-ray resonant reflectivity," Chin. Opt. Lett. 8, 170 (2010)

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    Paper Information

    Received: Nov. 30, 2009

    Accepted: --

    Published Online: May. 14, 2010

    The Author Email:

    DOI:10.3788/COL201008s1.0170

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