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Chinese Journal of Lasers, Volume. 26, Issue 1, 35(1999)

Accurate Reflectivity Measurement of High Reflective Mirrors via a Cavity Ring-down Method

[in Chinese]1, [in Chinese]1, [in Chinese]1, [in Chinese]2, and [in Chinese]2
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  • 2[in Chinese]
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    [1] [1] A. O′Keefe, D. A. G. Decon. Cavity ring-down optical spectrometer for absorption measurements using pulsed laser sources. Rev. Sci. Instru., 1988, 59(12):2544～2551

    CLP Journals

    [1] Zhang Shengwu, Huang Feng, Li Ming, Song Qiuming, Xie Bin, Wang Haiqian, Zhao Dongfeng, Chen Yang, Jiang Yousong, Song Yizhou. Process Control of High Reflectance Mirrors Preparation in Transition Region by Reactive Magnetron Sputtering[J]. Chinese Journal of Lasers, 2009, 36(1): 198

    [2] Tan Zhongqi, Long Xingwu, Zhang Bin. Detector's Response Characteristic and Its Influence on Metrical Result of Continuous-Wave Cavity Ring-Down Technique[J]. Chinese Journal of Lasers, 2009, 36(4): 959

    [3] YI Heng-yu, Peng Yong, HU Xiao-yang, LIU Sheng-lin, TIAN Xiao-qiang, LV Bai-da. Influence of Length Misadjustment of Ring-Down Cavity on Its Output Power[J]. Chinese Journal of Lasers, 2004, 31(s1): 486

    [4] SUN Liqin, CHEN Bing, HE Yabai, LI Mingxing, CHEN Xiang, KAN Ruifeng. Rapidly Swept Cavity Ring-Down Spectrometer and Its Trace-Level Gas Detection Application[J]. Journal of Atmospheric and Environmental Optics, 2016, 11(3): 197

    [5] Gao Lifeng, Xiong Shengming, Huang Wei, Kong Mingdong. Mid-IR Optical Parametric Oscillator for High Reflectivity Measurement[J]. Acta Optica Sinica, 2008, 28(s1): 151

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    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Accurate Reflectivity Measurement of High Reflective Mirrors via a Cavity Ring-down Method[J]. Chinese Journal of Lasers, 1999, 26(1): 35

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    Paper Information

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    Received: Sep. 22, 1997

    Accepted: --

    Published Online: Aug. 9, 2006

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    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology