Silicon nitride-based Kerr frequency combs and applications in metrology

Zhaoyang Sun; Yang Li; Benfeng Bai; Zhendong Zhu; Hongbo Sun

doi:10.1117/1.AP.4.6.064001

Advanced Photonics, Volume. 4, Issue 6, 064001(2022)

Silicon nitride-based Kerr frequency combs and applications in metrology Author Presentation

Zhaoyang Sun¹, Yang Li^1、*, Benfeng Bai^1、*, Zhendong Zhu², and Hongbo Sun^1、*

¹Tsinghua University, State Key Laboratory of Precision Measurement and Instruments, Department of Precision Instrument, Beijing, China

²National Institute of Metrology, Beijing, China

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Zhaoyang Sun, Yang Li, Benfeng Bai, Zhendong Zhu, Hongbo Sun, "Silicon nitride-based Kerr frequency combs and applications in metrology," Adv. Photon. 4, 064001 (2022)

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Paper Information

Category: Reviews

Received: Aug. 7, 2022

Accepted: Oct. 20, 2022

Posted: Oct. 20, 2022

Published Online: Nov. 15, 2022

The Author Email: Li Yang (yli9003@mail.tsinghua.edu.cn), Bai Benfeng (baibenfeng@tsinghua.edu.cn), Sun Hongbo (hbsun@tsinghua.edu.cn)

DOI:10.1117/1.AP.4.6.064001

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology