Chinese Optics, Volume. 18, Issue 1, 186(2025)
Effect of GaInP and GaAsP inserted into waveguide/barrier interface on carrier leakage in InAlGaAs quantum well 808-nm laser diode
Fig. 2. (a) Refractive index and TE mode optic field intensity distributions of three LDs; (b) magnified diagrams in the range of
Fig. 3. Curves of (a) quantum well external loss (
Fig. 4. (a) The energy band comparison of the LDs with three structures at an injection current of 10 A and (b) the magnification of LD1, LD2, and LD3 in the
Fig. 5. (a) Leakage current density, (b) auger recombination current density, (c) SRH recombination current density, and (d) nonradiative recombination current density of three LDs as a function of injection current
Fig. 6. (a) Threshold current of three LDs; (b) operating voltage, (c) output power and (d) WPE of three LDs as a function of injection current
Fig. 7. (a) Fitted curves of wavelength and (b) threshold current of three LDs as a function of temperature
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Meng-jie FU, Hai-liang DONG, Zhi-gang JIA, Wei JIA, Jian LIANG, Bing-she XU. Effect of GaInP and GaAsP inserted into waveguide/barrier interface on carrier leakage in InAlGaAs quantum well 808-nm laser diode[J]. Chinese Optics, 2025, 18(1): 186
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Received: Feb. 27, 2024
Accepted: May. 6, 2024
Published Online: Mar. 14, 2025
The Author Email: Hai-liang DONG (dhltyut@163.com), Bing-she XU (xubs@tyut.edu.cn)