Chinese Journal of Lasers, Volume. 46, Issue 10, 1004001(2019)

Measuring Axicon Surface By Using Annular Sub-Aperture Scanning Method

Yan Yan1,2, Feng Tang1、*, Xiangzhao Wang1, Yunjun Lu1, and Fudong Guo1
Author Affiliations
  • 1Laboratory of Information Optics and Optoelectronic Technology, Shanghai Institute of Optics and Fine Mechanics,Chinese Academy of Sciences, Shanghai 201800, China
  • 2University of Chinese Academy of Sciences, Beijing 100049, China
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    References(21)

    [16] Gao H M, Zhang X D, Fang F Z. Interferometry of a reflective axicon surface with a small cone angle using an optical inner surface[J]. Measurement Science and Technology, 28, 095204(2017).

    [17] Küchel M F. Interferometric measurement of rotationally symmetric aspheric surfaces[J]. Proceedings of SPIE, 7389, 738916(2009).

    [18] Küechel M F. Interferometric measurement of rotationally symmetric aspheric surfaces[J]. Proceedings of SPIE, 10316, 103160Q(2007).

    [21] Zhang X Q. Research of phase unwrapping based on quality map[D]. Harbin: Harbin Institute of Technology(2010).

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    Yan Yan, Feng Tang, Xiangzhao Wang, Yunjun Lu, Fudong Guo. Measuring Axicon Surface By Using Annular Sub-Aperture Scanning Method[J]. Chinese Journal of Lasers, 2019, 46(10): 1004001

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    Paper Information

    Category: measurement and metrology

    Received: Mar. 26, 2019

    Accepted: May. 13, 2019

    Published Online: Oct. 25, 2019

    The Author Email: Tang Feng (tangfeng@siom.ac.cn)

    DOI:10.3788/CJL201946.1004001

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