[1] [1] C. G. Rafael and E. W. Richard, Digital Image Processing, 2nd ed. (Publishing House of Electronics Industry, Beijing, 2002).

[2] [2] L. C. Jiao and S. Tan, Acta Electron. Sin. (in Chinese) 31, 1975 (2003).

[3] [3] M. N. Do and M. Vetterli, Stud. Comput. Math. 10, 83 (2003).

[4] [4] M. N. Do and M. Vetterli, IEEE Trans. Signal Process. 14, 2091 (2005).

[5] [5] A. Swaminathan, S. S. K. Ramapackiam, T. Thiraviam, and J. Selvaraj, Biomed. Tech. Biomed. Eng. 58, 87 (2013).

[6] [6] J. P. Zhou, A. L. Cunha, and M. N. Do, in Proceedings of IEEE International Conference on Image Processing I-469 (2005).

[7] [7] A. L. Cunha, J. P. Zhou, and M. N. Do, IEEE Trans. Image Pro-cess. 10, 3089 (2006).

[8] [8] S. Li, L. Fang, and H. Yin, IEEE Geosci. Remote Sensing Lett. 9, 836 (2012).

[9] [9] H. J. Li, Z. M. Zhao, and X. L. Yu, IET Image Process. 6, 264 (2012).

[10] [10] Q. W. Li, G. Y. Huo, H. Li, G. C. Ma, and A. Y. Shi, IET Radar Sonar Nav. 6, 526 (2012).

[11] [11] C. C. Lee, C. Y. Shih, S. K. Lee, and W. T. Hong, Multidimen. Syst. Sign. Process. 23, 423 (2012).

[12] [12] H. Soyel and P. W. Mcowan, Electron. Lett. 48, 917 (2012).

[13] [13] D. L. Donoho and I. Johnstone, Biometrika 81, 425 (1994).

[14] [14] D. D. Y. Po and M. N. Do, IEEE Trans. Image Process. 15, 1610 (2006).

[15] [15] Y. Shao, F. C. Sun, and Y. Liu, J Electron Inform. Technol. (in Chinese) 34, 1779 (2012).