Chinese Journal of Lasers, Volume. 14, Issue 3, 167(1987)

Measurement of spectral linewidth of semiconductor lasers

Du Xiaocfiehg, He Zhengchuan, and Tang Sulan
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    References(6)

    [1] [1] T. Okoshi et al.; Electr. Lett., 1980, 16, No. 8, 630.

    [2] [2] Y. Suematsu; Optical Device and Fibers, Ohmsa, LTD and North-Holland Publishing Company Tokyo, 1982, p. 51.

    [3] [3] L. Goldberg et al.; Electr. Lett., 1981, 17, No. 19,677.

    [4] [4] P. Favre et al.; IEEE J. Quant. Electr., 1982, QE-18, No. 10, 1717.

    [5] [5] K.-Y. Liou, C. A. Barrus; Electr. Lett., 1985, 21,No. 8,354,

    [6] [6] A. Maitland, Μ. H. Dunn; Laser Physics, North-HolJand Publishing Company Amsterdam -London, 1969, p.292.

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    Du Xiaocfiehg, He Zhengchuan, Tang Sulan. Measurement of spectral linewidth of semiconductor lasers[J]. Chinese Journal of Lasers, 1987, 14(3): 167

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    Paper Information

    Category: laser devices and laser physics

    Received: Feb. 13, 1986

    Accepted: --

    Published Online: Aug. 10, 2012

    The Author Email:

    DOI:

    CSTR:32186.14.

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