Opto-Electronic Engineering, Volume. 30, Issue 4, 42(2003)
An automatic testing system based on CCD for color display tube electron beam landing screen error
References(2)
[1] [1] WILLIAM E G. Consumer Displays of the Future[J]. IEEE Transaction on Consumer Electronic, 1996, 42(3):573-576.
[2] [2] HYEONGYU K, SEYOUNG I. Analysis of beam landing shifts due to thermal deformations of a shadow mask [J]. IEEE Transaction on Consumer Electronic, 1994, 40(1):47-54.
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[in Chinese], [in Chinese], [in Chinese]. An automatic testing system based on CCD for color display tube electron beam landing screen error[J]. Opto-Electronic Engineering, 2003, 30(4): 42
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