[1] Su H. High accuracy structured light vision measurement method[D]. Harbin: Harbin Engineering University(2014).

[2] Willi S, Grundhofer A. Robust geometric self-calibration of generic multi-projector camera systems. [C]∥IEEE International Symposium on Mixed and Augmented Reality, 42-51(2017).

[3] Nguye H, Nguyen D, Wang Z et al. Real-time, high-accuracy 3D imaging and shape measurement[J]. Applied Optics, 54, A9-A17(2015). http://www.opticsinfobase.org/abstract.cfm?URI=ao-54-1-A9

[4] Hoang T, Pan B, Nguyen D et al. Generic gamma correction for accuracy enhancement in fringe-projection profilometry[J]. Optics Letters, 35, 1992-1994(2012). http://www.opticsinfobase.org/abstract.cfm?URI=ol-35-12-1992

[5] Zheng D L, Da F P. Gamma correction method for accuracy enhancement in grating projection profilometry[J]. Acta Optica Sinica, 31, 0512003(2011).

[6] Xiao Y S, Cao Y P, Wu Y C et al. Gamma nonlinearity correction based on Fourier spectrum analysis for phase measuring profilometry[J]. Acta Optica Sinica, 32, 1212004(2012).

[7] Lin J Y, Huang J Q, Jiang K Y. Subregional Gamma pre-coding correction for phase error compensation[J]. Opto-Electronic Engineering, 43, 32-38(2016).

[8] Li Z, Li Y. Gamma-distorted fringe image modeling and accurate gamma correction for fast phase measuring profilometry[J]. Optics Letters, 36, 154-156(2011). http://www.opticsinfobase.org/abstract.cfm?URI=ol-36-2-154

[9] Chen Y, Zhai L, Bao Q et al. Nonlinear error correction method for entocentric projection in phase measuring profilometry[J]. Natural Science, 43, 150-154(2017).

[10] Zhang S, Yau S T. Generic nonsinusoidal phase error correction for three-dimensional shape measurement using a digital video projector[J]. Applied Optics, 46, 36-43(2007). http://www.opticsinfobase.org/abstract.cfm?uri=ao-46-1-36

[11] Zheng D L, Da F P. Double-step phase-shifting algorithm for fringe-projection measurement[J]. Acta Optica Sinica, 32, 0512004(2012).

[12] Yao J, Chen X, Zhou Y et al. Phase error elimination considering gamma nonlinearity, system vibration, and noise for fringe projection profilometry[J]. Optical Engineering, 53, 094102(2014). http://spie.org/Publications/Journal/10.1117/1.OE.53.9.094102

[13] Pan B, Kemao Q, Huang L. et al. Phase error analysis and compensation for nonsinusoidal waveforms in phase-shifting digital fringe projection profilometry[J]. Optics Letters, 34, 416-418(2009). http://europepmc.org/abstract/MED/19373326

[14] Ma S, Quan C, Zhu R. et al. A fast and accurate gamma correction based on Fourier spectrum analysis for digital fringe projection profilometry[J]. Optics Communications, 285, 533-538(2012). http://www.sciencedirect.com/science/article/pii/S0030401811012818

[15] Zhou P, Liu X, He Y et al. Phase error analysis and compensation considering ambient light for phase measuring profilometry[J]. Optics & Lasers in Engineering, 55, 99-104(2014). http://www.sciencedirect.com/science/article/pii/S0143816613003254

[16] Zhang C, Zhao H, Zhang L et al. Full-field phase error detection and compensation method for digital phase-shifting fringe projection profilometry[J]. Measurement Science & Technology, 26, 035201(2015). http://adsabs.harvard.edu/abs/2015MeScT..26c5201Z

[17] Majumder A, Stevens R. Color nonuniformity in projection-based displays: analysis and solutions[J]. IEEE Transactions on Visualization & Computer Graphics, 10, 177-188(2004). http://www.ncbi.nlm.nih.gov/pubmed/15384642/

[18] Lv F, Xing S, Guo H. Self-correction of projector nonlinearity in phase-shifting fringe projection profilometry[J]. Applied Optics, 56, 7204-7216(2017). http://www.ncbi.nlm.nih.gov/pubmed/29047982

[19] Xiao Y, Cao Y, Wu Y et al. Single orthogonal sinusoidal grating for gamma correction in digital projection phase measuring profilometry[J]. Optical Engineering, 52, 053605(2013). http://spie.org/Publications/Journal/10.1117/1.OE.52.5.053605

[20] Cui Y J, Zhang W F, Li J X et al. A Method of Gamma correction in fringe projection measurement[J]. Acta Optica Sinica, 35, 0112002(2015).

[21] Xiao C, Chen F, Zhong M. Method for improving measurement accuracy of inverse fringe[J]. Laser & Optoelectronics Progress, 53, 111204(2016).