NUCLEAR TECHNIQUES, Volume. 46, Issue 8, 080007(2023)

Development and application of a radiation effect evaluation method of aerospace integrated circuits for radiation hardened by design

Hongchao ZHENG1...2, Liang WANG1,2, Zhe LI1,2, Gang GUO3, and Yuanfu ZHAO12,* |Show fewer author(s)
Author Affiliations
  • 1Beijing Microelectronics Technology Institute, Beijing 100076, China
  • 2Laboratory of Science and Technology on Radiation-Hardened Integrated Circuits, China Aerospace Science and Technology Corporation, Beijing 100076, China
  • 3Institute of Nuclear Physics, China Institute of Atomic Energy, Beijing 102413, China
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    Figures & Tables(15)
    RDFD-DFF structure
    EQDD method layout
    DFT and function mode SEE Weibull curve
    MBIST structure
    SEE effective irradiation time based on the MBIST algorithm
    Full scale test method based on the beat frequency
    SEU captured in high-speed signals
    SEU drop in a flip-chip circuit by a Cl ion
    Effective LET of Cl and Si in a flip-chip circuit
    Proton SEU CS of non-radiation-hardened SRAM
    Proton SEU CS of radiation-hardened SRAM
    Auto-measurement-control matrix system
    SEE test HI-13 terminal
    SEU cross-section of DFF at different vectors
    SEU time-domain analysis diagram
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    Hongchao ZHENG, Liang WANG, Zhe LI, Gang GUO, Yuanfu ZHAO. Development and application of a radiation effect evaluation method of aerospace integrated circuits for radiation hardened by design[J]. NUCLEAR TECHNIQUES, 2023, 46(8): 080007

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    Paper Information

    Category: Research Articles

    Received: Jun. 5, 2023

    Accepted: --

    Published Online: Sep. 19, 2023

    The Author Email:

    DOI:10.11889/j.0253-3219.2023.hjs.46.080007

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