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Acta Optica Sinica, Volume. 42, Issue 24, 2423001(2022)

Correction of Spectral Line Curvature of Transmission Spectrometers By Off-Axis Slit

Zhikun Wu1,2,3,4, Entao Shi1,3,4, Yongmei Wang1,2,3,4、*, and Baoze Guo1,2,3,4
Author Affiliations
  • 1National Space Science Center, Chinese Academy of Sciences, Beijing 100190, China
  • 2University of Chinese Academy of Sciences, Beijing 100049, China
  • 3Beijing Key Laboratory of Space Environment Exploration, Beijing 100190, China
  • 4Key Laboratory of Science and Technology on Environmental Space Situation Awareness, Chinese Academy of Sciences, Beijing 100190, China
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    AbstractGet PDF(in Chinese)
    Figures&Tables (14)
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    References (19)
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    Figures & Tables(14)
    Diffraction principle of non-dominant cross section of gratings

    Fig. 1. Diffraction principle of non-dominant cross section of gratings

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    Local coordinate system of convergence lens

    Fig. 2. Local coordinate system of convergence lens

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    Spectral line curvature of spectrometer model. (a) Ideal spectrometer; (b) curved spectral line; (c) Keystone distortion; (d) Smile distortion

    Fig. 3. Spectral line curvature of spectrometer model. (a) Ideal spectrometer; (b) curved spectral line; (c) Keystone distortion; (d) Smile distortion

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    Spectral line curvature of central wavelength is corrected. (a) Curved slit; (b) curved spectral line; (c) Keystone distortion; (d) Smile distortion

    Fig. 4. Spectral line curvature of central wavelength is corrected. (a) Curved slit; (b) curved spectral line; (c) Keystone distortion; (d) Smile distortion

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    Slit off-axis distance calculation. (a) Variation of standard deviation with off-axis distance; (b) off-axis amount of slit and its distortion

    Fig. 5. Slit off-axis distance calculation. (a) Variation of standard deviation with off-axis distance; (b) off-axis amount of slit and its distortion

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    Flow chart of slit off-axis design

    Fig. 6. Flow chart of slit off-axis design

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    Optical path diagram of spectrometer system

    Fig. 7. Optical path diagram of spectrometer system

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    RMS diffuse spot radius. (a) Spatial dimension (X); (b) spectral dimension (Y)

    Fig. 8. RMS diffuse spot radius. (a) Spatial dimension (X); (b) spectral dimension (Y)

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    Spectral line curvature of design results. (a) Smile distortion; (b) Keystone distortion

    Fig. 9. Spectral line curvature of design results. (a) Smile distortion; (b) Keystone distortion

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    Principle prototype

    Fig. 10. Principle prototype

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    Measurement results of Smile distortion. (a) Slit function measurement result; (b) Smile distortion

    Fig. 11. Measurement results of Smile distortion. (a) Slit function measurement result; (b) Smile distortion

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    Keystone distortion test results. (a) Peak finding results in different fields of view; (b) Keystone distortion

    Fig. 12. Keystone distortion test results. (a) Peak finding results in different fields of view; (b) Keystone distortion

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    • Table 1. Spectral range corresponding to observation object

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      Table 1. Spectral range corresponding to observation object

      ProductWavelength range /nm
      Tropospheric ozone305-330
      Sulphur dioxide308-325
      Albedo310-500
      Total ozone325-337
      Aerosol336-340
      Formaldehyde337-360
      Rayleigh scattering360-400
      Aerosol absorption360-400
      Aerosol400-430
      Nitrogen dioxide405-500
      Glyoxal430-460
      Aerosol440-460
      Cloud460-490

    • Table 2. Parameters of spectrometer system

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      Table 2. Parameters of spectrometer system

      ParameterSpectral range /nmSpectral resolution /nmSpectral oversampling numberPixel size /（μm×μm）Focal length of collimating lensFocal length of converging lensSpatial sampling distance /μmGroove density /（line·mm-1）
      Value300-5000.5411×1116015033600
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    Zhikun Wu, Entao Shi, Yongmei Wang, Baoze Guo. Correction of Spectral Line Curvature of Transmission Spectrometers By Off-Axis Slit[J]. Acta Optica Sinica, 2022, 42(24): 2423001

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    Paper Information

    Category: Optical Devices

    Received: May. 12, 2022

    Accepted: Jul. 22, 2022

    Published Online: Dec. 14, 2022

    The Author Email: Wang Yongmei (wym@nssc.ac.cn)

    DOI:10.3788/AOS202242.2423001

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology