OPTICS & OPTOELECTRONIC TECHNOLOGY, Volume. 19, Issue 2, 108(2021)

Analysis of Film Thickness Uniformity of Large-Diameter Aluminum Film Deposited by Thermal Evaporation

FAN Yan-zheng, PAN Yong-qiang*, LIU Jin-ze, and ZHANG Da
Author Affiliations
  • [in Chinese]
  • show less
    References(1)

    [1] [1] Sheikh D A, Connell S J, Dummer R S. Durable silver coating for Kepler Space Telescope primary mirror[C]. Proc.SPIE: 2008,7010: 70104E.

    Tools

    Get Citation

    Copy Citation Text

    FAN Yan-zheng, PAN Yong-qiang, LIU Jin-ze, ZHANG Da. Analysis of Film Thickness Uniformity of Large-Diameter Aluminum Film Deposited by Thermal Evaporation[J]. OPTICS & OPTOELECTRONIC TECHNOLOGY, 2021, 19(2): 108

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Save article for my favorites
    Paper Information

    Category:

    Received: Oct. 22, 2020

    Accepted: --

    Published Online: Aug. 23, 2021

    The Author Email: Yong-qiang PAN (pyq_867@163.com)

    DOI:

    CSTR:32186.14.

    Topics