Opto-Electronic Engineering, Volume. 48, Issue 1, 200072(2021)

Insulator nondestructive testing based on VGGNet algorithm

Ma Lixin*, Dou Chenfei, Song Chencan, and Yang Tianxiao
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    Ma Lixin, Dou Chenfei, Song Chencan, Yang Tianxiao. Insulator nondestructive testing based on VGGNet algorithm[J]. Opto-Electronic Engineering, 2021, 48(1): 200072

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    Paper Information

    Received: Mar. 6, 2020

    Accepted: --

    Published Online: Sep. 2, 2021

    The Author Email: Lixin Ma (ma_eeepsi@163.com)

    DOI:10.12086/oee.2021.200072

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