Opto-Electronic Engineering, Volume. 48, Issue 1, 200072(2021)
Insulator nondestructive testing based on VGGNet algorithm
Get Citation
Copy Citation Text
Ma Lixin, Dou Chenfei, Song Chencan, Yang Tianxiao. Insulator nondestructive testing based on VGGNet algorithm[J]. Opto-Electronic Engineering, 2021, 48(1): 200072
Received: Mar. 6, 2020
Accepted: --
Published Online: Sep. 2, 2021
The Author Email: Lixin Ma (ma_eeepsi@163.com)